RELEASED
PM7383 FREEDM-32A256
DATASHEET
PMC-2010336
ISSUE 1
FRAME ENGINE AND DATA LINK MANAGER 32A256
Shift-IR
The shift instruction register state is used to shift both the instruction register and
the selected test data registers by one stage. Shifting is from MSB to LSB and
occurs on the rising edge of TCK.
Update-IR
The update instruction register state is used to load a new instruction into the
instruction register. The new instruction must be scanned in using the Shift-IR
state. The load occurs on the falling edge of TCK.
The Pause-DR and Pause-IR states are provided to allow shifting through the
test data and/or instruction registers to be momentarily paused.
Boundary Scan Instructions
The following is a description of the standard instructions. Each instruction
selects a serial test data register path between input, TDI and output, TDO.
BYPASS
The bypass instruction shifts data from input, TDI to output, TDO with one TCK
clock period delay. The instruction is used to bypass the device.
EXTEST
The external test instruction allows testing of the interconnection to other
devices. When the current instruction is the EXTEST instruction, the boundary
scan register is place between input, TDI and output, TDO. Primary device
inputs can be sampled by loading the boundary scan register using the
Capture-DR state. The sampled values can then be viewed by shifting the
boundary scan register using the Shift-DR state. Primary device outputs can be
controlled by loading patterns shifted in through input TDI into the boundary scan
register using the Update-DR state.
SAMPLE
The sample instruction samples all the device inputs and outputs. For this
instruction, the boundary scan register is placed between TDI and TDO. Primary
device inputs and outputs can be sampled by loading the boundary scan register
PROPRIETARY AND CONFIDENTIAL
185
PMC [ PMC-SIERRA, INC ]
