Philips Semiconductors
Product specification
Fault-tolerant CAN transceiver
TJA1054A
SYMBOL
∆V
th(wake)
PARAMETER
difference of wake-up
threshold voltages
CONDITIONS
low power modes
normal operating mode and
failures 4, 6 and 7
V
CC
= 5 V
V
CC
= 4.75 to 5.25 V
MIN.
0.8
TYP.
1.4
−
MAX.
UNIT
V
V
th(CANH)(se)
single-ended receiver
threshold voltage on
pin CANH
1.5
0.30V
CC
1.7
0.34V
CC
1.85
0.37V
CC
V
V
normal operating mode and
V
th(CANL)(se)
single-ended receiver
threshold voltage on pin CANL failures 3 and 3a
V
CC
= 5 V
V
CC
= 4.75 to 5.25 V
R
i(CANH)(se)
R
i(CANL)(se)
R
i(dif)
R
sw(RTL)
R
sw(RTH)
V
O(RTH)
I
O(RTL)
I
pu(RTL)
I
pd(RTH)
single-ended input resistance
on pin CANH
single-ended input resistance
on pin CANL
differential input resistance
normal operating mode
normal operating mode
normal operating mode
3.15
0.63V
CC
110
110
220
−
−
3.3
0.66V
CC
165
165
330
3.45
0.69V
CC
270
270
540
V
V
kΩ
kΩ
kΩ
Ω
Ω
V
mA
µA
µA
Pins RTH and RTL
switch-on resistance between
pin RTL and V
CC
switch-on resistance between
pin RTH and ground
output voltage on pin RTH
output current on pin RTL
pull-up current on pin RTL
pull-down current on pin RTH
normal operating mode;
I
O
< 10 mA
normal operating mode;
I
O
< 10 mA
low power modes;
V
RTL
= 0 V
normal operating mode and
failures 4, 6 and 7
normal operating mode and
failures 3 and 3a
50
50
0.7
−0.65
75
75
100
100
1.0
−0.3
−
−
low power modes; I
O
= 1 mA
−
−1.25
−
−
Thermal shutdown
T
j(sd)
Notes
1. All parameters are guaranteed over the virtual junction temperature range by design, but only 100% tested at
T
amb
= 125
°C
for dies on wafer level, and above this for cased products 100% tested at T
amb
= 25
°C,
unless
otherwise specified.
2. For bare die, all parameters are only guaranteed if the back side of the die is connected to ground.
3. A local or remote wake-up event will be signalled at the transceiver pins RXD and NERR if V
BAT
= 5.3 V to 27 V
(see Table 2).
junction temperature for
shutdown
155
165
180
°C
2004 Mar 23
13
PHILIPS [ NXP SEMICONDUCTORS ]
