Philips Semiconductors
Product specification
Low-voltage high performance mixer FM IF system
SA606
-25dB,
-10dB,
-29dB,
929/50Ω PAD
-10.6dB,
50/50Ω PAD
-36dB,
156k/50Ω PAD
1500/50Ω PAD 50/50Ω PAD
C26
51.5
96.5
51.7
96.5
32.6
50.5
R18
3.3k
71.5
32.8
2430
C24
71.5
C22
1.3k
3880
C20
R17
2.4k
C15
C19
C16
SW9
FLT1 SW8
C23
SW7
SW6
FLT2
SW5
C18
C21
C17
20
19
18
17
16
15
14
13
12
11
IF
AMP
LIMITER
MIXER
RSSI
QUAD
OSCILLATOR
+
+
–
–
V
REG
AUDIO
1
2
3
4
5
6
7
8
9
10
R13
R11
SW10
SW11
R14
R9
SW1
L1
SW3
SW4
C8
C1
C2
R10
C27
C9
C12
C7
R12
R19
16k
C5
C6
C10
R4
51.1
DEEMPHASIS
FILTER
IFT1
L2
SW2
X1
R1
C4
C3
R2
EXT.
LOC
R7
30.5
”C” WEIGHTED
AUDIO
OSC
R3
45MHZ
MEASUREMENT
CIRCUIT
C14
44.545
R8
39.2
R6
178
45.06
MHZ
AUDIO
RSSI
V
CC
MINI–CIRCUIT ZSC2–1B
Automatic Test Circuit Component List
C27
C1 100pF NPO Ceramic
C2 390pF NPO Ceramic
C5
C6 22pF NPO Ceramic
C7 1nF Ceramic
2.2µF +10% Monolithic Ceramic
Flt 1 Ceramic Filter Murata SFG455A3 or equiv
Flt 2 Ceramic Filter Murata SFG455A3 or equiv
IFT 1 455kHz (Ce = 180pF) Toko RMC–2A6597H
L1 147–160nH Coilcraft UNI–10/142–04J08S
100nF +10% Monolithic Ceramic
C8 10.0pF NPO Ceramic
L2
0.8µH nominal
Toko 292CNS–T1038Z
X1 44.545MHz Crystal ICM4712701
C9
100nF +10% Monolithic Ceramic
C10
C12
C14
10µF Tantalum (minimum) *
2.2µF
100nF +10% Monolithic Ceramic
R9
R10
R11
2kΩ +1% 1/4W Metal Film
10kΩ +1%
10kΩ +1%
C15 10pF NPO Ceramic
C17
R12
R13
R14
R17
R18
R19
100nF +10% Monolithic Ceramic
2kΩ +1%
20kΩ +1%
10kΩ +1%
2.4kΩ +5% 1/4W Carbon Composition
3.3kΩ
16kΩ
C18
C21
C23
C25
C26
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
*NOTE: This value can be reduced when a battery is the power source.
SR00349
Figure 3. SA606 45MHz Test Circuit (Relays as shown)
5
1997 Nov 07
NXP [ NXP ]
