HEF4538B-Q100
NXP Semiconductors
Dual precision monostable multivibrator
V
DD
V
V
O
I
G
DUT
C
L
R
T
001aag182
Test data is given in Table 10.
Definitions for test circuit:
CL = load capacitance including jig and probe capacitance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig 11. Test circuit
Table 10. Test data
Supply voltage
VDD
Input
Load
CL
VI
tr, tf
5 V to 15 V
VSS or VDD
20 ns
50 pF
HEF4538B_Q100
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Product data sheet
Rev. 2 — 10 December 2013
12 of 17
NXP [ NXP ]
