HEF4052B
Nexperia
Dual 4-channel analog multiplexer/demultiplexer
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Test data is given in Table 10.
Definitions:
DUT = Device Under Test.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including test jig and probe.
RL = Load resistance.
Fig 16. Test circuit for measuring switching times
Table 10. Test data
Input
Load
CL
S1 position
[1]
nYn, nZ
Sn and E tr, tf
VM
RL
tPHL
tPLH
tPZH, tPHZ tPZL, tPLZ other
VEE VDD VEE
VDD or VEE VDD or VSS 20 ns
0.5VDD
50 pF
10 k VDD or VEE VEE
[1] For nYn to nZ propagation delays use VEE. For Sn to nYn or nZ propagation delays use VDD
.
HEF4052B
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Nexperia B.V. 2017. All rights reserved
Product data sheet
Rev. 10 — 25 March 2016
12 of 21
NXP [ NXP ]
