Philips Semiconductors
Product specification
Quad 2-input NAND gate
74LVC00A
LOGIC DIAGRAM (ONE GATE)
A
Y
B
FUNCTION TABLE
INPUTS
nA
L
SV00379
OUTPUTS
nB
L
H
L
H
nY
H
H
H
L
L
H
H
NOTES:
H = HIGH voltage level
L = LOW voltage level
RECOMMENDED OPERATING CONDITIONS
LIMITS
SYMBOL
V
CC
V
CC
V
I
V
O
T
amb
t
r
, t
f
PARAMETER
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC Input voltage range
DC output voltage range
Operating ambient temperature range in free-air
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
CONDITIONS
MIN
2.7
1.2
0
0
–40
0
0
MAX
3.6
3.6
5.5
V
CC
+85
20
10
V
V
V
V
°C
ns/V
UNIT
ABSOLUTE MAXIMUM RATINGS
1
Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
V
CC
I
IK
V
I
I
OK
V
O
I
O
I
GND
, I
CC
T
stg
P
TOT
PARAMETER
DC supply voltage (for max. speed
performance)
DC input diode current
DC input voltage
DC output diode current
DC output voltage
DC output source or sink current
DC V
CC
or GND current
Storage temperature range
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
above +70°C derate linearly with 8 mW/K
above +60°C derate linearly with 5.5 mW/K
V
I
t0
Note 2
V
O
uV
CC
or V
O
t
0
Note 2
V
O
= 0 to V
CC
CONDITIONS
RATING
–0.5 to +6.5
–50
–0.5 to +5.5
"50
–0.5 to V
CC
+ 0.5
"50
"100
–65 to +150
500
500
UNIT
V
mA
V
mA
V
mA
mA
°C
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Apr 28
3
PHILIPS [ NXP SEMICONDUCTORS ]
