Philips Semiconductors
Product specification
Phase-locked-loop with VCO
74HC/HCT4046A
T
amb
(°C)
SYM-
PARAMETER
BOL
74HC
+25
−40
to +85
−40
to +125
min.
max.
kΩ
kΩ
kΩ
UNIT
TEST CONDITIONS
V
CC
(V)
OTHER
V
I
min. typ. max. min. max.
R
I
input resistance
SIG
IN
, COMP
IN
800
250
150
3.0
4.5
6.0
V
I
at self-bias
operating point;
∆
V
I
= 0.5 V;
see Figs 12, 13
and 14
VCO section
Voltages are referenced to GND (ground = 0 V)
T
amb
(°C)
SYM-
BOL
74HC
PARAMETER
+25
min.
V
IH
HIGH level
input voltage
INH
LOW level
input voltage
INH
HIGH level
output voltage
VCO
OUT
HIGH level
output voltage
VCO
OUT
LOW level
output voltage
VCO
OUT
LOW level
output voltage
VCO
OUT
LOW level output
voltage C1
A
, C1
B
input leakage
current
INH, VCO
IN
resistor range
3.0
3.0
3.0
1997 Nov 25
2.9
4.4
5.9
2.1
4.2
typ.
1.7
3.2
1.3
2.1
2.8
3.0
4.5
6.0
0.9
1.35
1.8
2.9
4.4
5.9
3.84
5.34
0.1
0.1
0.1
0.26
0.26
0.40
0.40
0.1
0.1
0.1
0.1
0.33
0.33
0.47
0.47
1.0
−40
to +85
−40
to +125
max.
V
3.0
4.5
6.0
0.9
1.35
1.8
2.9
4.4
5.9
3.7
5.2
0.1
0.1
0.1
0.4
0.4
0.54
0.54
1.0
µA
V
V
V
V
V
V
3.0
4.5
6.0
3.0
4.5
6.0
4.5
6.0
3.0
4.5
6.0
4.5
6.0
4.5
6.0
6.0
V
IH
or
V
IL
V
IH
or
V
IL
V
IH
or
V
IL
V
IH
or
V
IL
V
IH
or
V
IL
V
CC
or
GND
note 1
−I
O
= 20
µA
−I
O
= 20
µA
−I
O
= 20
µA
−I
O
= 4.0 mA
−I
O
= 5.2 mA
I
O
= 20
µA
I
O
= 20
µA
I
O
= 20
µA
I
O
= 4.0 mA
I
O
= 5.2 mA
I
O
= 4.0 mA
I
O
= 5.2 mA
UNIT
V
CC
(V)
TEST CONDITIONS
OTHER
V
I
max. min. max. min.
2.1
3.15
4.2
0.9
1.35
1.8
2.1
3.15
4.2
3.15 2.4
V
IL
V
OH
V
OH
3.98 4.32
5.48 5.81
0
0
0
0.15
0.16
V
OL
V
OL
V
OL
±I
I
R1
300
300
300
11
kΩ
3.0
4.5
6.0
PHILIPS [ NXP SEMICONDUCTORS ]
