Philips Semiconductors
Product specification
Quad 2-input AND gate
74F08
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
CC
V
IN
I
IN
V
OUT
I
OUT
T
amb
T
stg
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
Current applied to output in Low output state
Commercial range
Operating free-air temperature range
free air
Storage temperature range
Industrial range
PARAMETER
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
–0.5 to V
CC
40
0 to +70
–40 to +85
–65 to +150
UNIT
V
V
mA
V
mA
°C
°C
°C
RECOMMENDED OPERATING CONDITIONS
LIMITS
SYMBOL
V
CC
V
Ih
V
IL
I
IK
I
OH
I
OL
T
amb
b
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Commercial range
O erating
Operating free-air tem erature range
temperature
Industrial range
0
–40
PARAMETER
MIN
4.5
2.0
0.8
–18
–1
20
+70
+85
NOM
5.0
MAX
5.5
UNIT
V
V
V
mA
mA
mA
°C
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
OH
= MAX
Low-level
Low level output voltage
Input clamp voltage
Input current at maximum input
voltage
High-level input current
Low-level input current
Short-circuit output current
3
Supply current (total)
I
CCH
I
CCL
V
CC
= MIN, V
IL
= MAX
V
IH
= MIN, I
Ol
= MAX
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX
V
CC
= MAX
V
CC
= MAX
V
IN
= 4.5V
V
IN
= GND
–60
5.5
8.6
±10%V
CC
±5%V
CC
±10%V
CC
±5%V
CC
LIMITS
MIN
2.5
2.7
3.4
0.30
0.30
–0.73
0.50
0.50
–1.2
100
20
–0.6
–150
8.3
12.9
TYP
2
MAX
UNIT
V
V
V
V
V
µA
µA
mA
mA
mA
mA
V
O
OH
High level output voltage
High-level
V
O
OL
V
IK
I
I
I
IH
I
IL
I
OS
I
CC
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
1995 Apr 19
3
PHILIPS [ NXP SEMICONDUCTORS ]
