Philips Semiconductors
Product specification
Octal transceiver with direction pin
and 30Ω series termination resistors (3-State)
74ABT2245
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
T
amb
= +25°C
Min
V
IK
Input clamp voltage
V
CC
= 4.5V; I
IK
= –18mA
V
CC
= 4.5V; I
OH
= –3mA; V
I
= V
IL
or V
IH
V
OH
High-level output voltage
V
CC
= 5.0V; I
OH
= –3mA; V
I
= V
IL
or V
IH
V
CC
= 4.5V; I
OH
= –32mA; V
I
= V
IL
or V
IH
V
O
OL
Low-level
Low level output voltage
Input leakage
g
current
Control pins
Data pins
V
CC
= 4.5V; I
OL
= 5mA; V
I
= V
IL
or V
IH
V
CC
= 4.5V; I
OL
= 12mA; V
I
= V
IL
or V
IH
V
CC
= 5.5V; V
I
= GND or 5.5V
V
CC
= 5.5V; V
I
= GND or 5.5V
V
CC
= 0.0V; V
I
or V
O
≤
4.5V
V
CC
= 2.1V; V
O
= 0.5V; V
I
= GND or V
CC
;
V
OE
= Don’t care
V
CC
= 5.5V; V
O
= 2.7V; V
I
= V
IL
or V
IH
V
CC
= 5.5V; V
O
= 0.5V; V
I
= V
IL
or V
IH
V
CC
= 5.5V; V
O
= 5.5V; V
I
= GND or V
CC
V
CC
= 5.5V; V
O
= 2.5V
V
CC
= 5.5V; Outputs High, V
I
= GND or V
CC
Quiescent su ly current
supply
V
CC
= 5.5V; Outputs Low, V
I
= GND or V
CC
V
CC
= 5.5V; Outputs 3-State;
V
I
= GND or V
CC
Outputs enabled, one input at 3.4V, other
inputs at V
CC
or GND; V
CC
= 5.5V
∆I
CC
Additional supply current per
input pin
2
Outputs 3-State, one data input at 3.4V,
other inputs at V
CC
or GND; V
CC
= 5.5V
Outputs 3-State, one enable input at 3.4V,
other inputs at V
CC
or GND; V
CC
= 5.5V
–40
2.5
3.0
2.0
Typ
–0.9
2.9
3.4
2.4
0.32
0.5
±0.01
±5
±5.0
±5.0
5.0
–5.0
5.0
–100
50
24
50
0.5
50
0.5
0.55
0.8
±1.0
±100
±100
±50
50
–50
50
–180
250
30
250
1.5
250
1.5
–40
Max
–1.2
2.5
3.0
2.0
0.55
0.8
±1.0
±100
±100
±50
50
–50
50
–180
250
30
250
1.5
250
1.5
T
amb
= –40°C
to +85°C
Min
Max
–1.2
V
V
V
V
V
V
µA
µA
µA
µA
µA
µA
µA
mA
µA
mA
µA
mA
µA
mA
UNIT
I
I
I
OFF
I
PU
/I
PD
I
IH
+ I
OZH
I
IL
+ I
OZL
I
CEX
I
O
I
CCH
I
CCL
I
CCZ
Power-off leakage current
Power-up/down 3-State
output current
3
3-State output High current
3-State output Low current
Output high leakage current
Output current
1
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. This parameter is valid for any V
CC
between 0V and 2.1V with a transition time of up to 10msec. From V
CC
= 2.1V to V
CC
= 5V
±
10%, a
transition time of up to 100µsec is permitted.
1998 Jan 16
5
PHILIPS [ NXP SEMICONDUCTORS ]
