NXP Semiconductors
TDA5051A
Home automation modem
13. Test information
1
μF
DATA_IN
pulse
generator
300 Hz
50 %
1
10
TX_OUT
G
DATA_OUT
2
TDA5051A
(to be tested)
14
7
Y1
Y2
8
30
Ω
RX_IN
10 nF
OSCILLOSCOPE
XTAL
f
osc
DATA_IN
TX_OUT/RX_IN
DATA_OUT
t
d(dem)(su)
t
d(dem)(h)
002aaf051
Fig 21. Test set-up for measuring demodulation delay
coupling network
(3)
OSC1
TX_OUT
10
μF
33 nF 47
μH
CISPR16 network
(4)
7
10
250 nF
TDA5051A
OSC2
8
1
13, 3, 11
DATA_IN
V
DDA
, V
DDD
, V
DDAP
33 nF
47
μH
50
μH
50
Ω
5
Ω
12, 5, 9 AGND, DGND, APGND
250 nF
(1)
(2)
+5 V
POWER
SUPPLY
50
μH
5
Ω
G
SPECTRUM
ANALYZER
50
Ω
002aaf052
(1) Square wave TTL signal 300 Hz, duty factor = 50 % for measuring signal bandwidth
(see
Figure 3).
(2) DATA_IN + LOW for measuring total harmonic distortion (see
Figure 3).
(3) Tuned for f
= 132.5 kHz.
(4) The CISPR16 network provides a
−6
dB attenuation.
Fig 22. Test set-up for measuring THD and bandwidth of the TX_OUT signal
TDA5051A
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© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 5 — 13 January 2011
20 of 29
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