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3511-52 参数 Datasheet PDF下载

3511-52图片预览
型号: 3511-52
PDF下载: 下载PDF文件 查看货源
内容描述: 1500兆赫低功率的UltraCMOS ?分频预分频器 [1500 MHz Low Power UltraCMOS⑩ Divide-by-2 Prescaler]
分类和应用: 预分频器
文件页数/大小: 8 页 / 224 K
品牌: PEREGRINE [ PEREGRINE SEMICONDUCTOR CORP. ]
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PE3511
Product Specification
Figure 3. Pin Configuration (Top View)
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS™ device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the rating specified in Table 6.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS™
devices are immune to latch-up.
pin 1
NC
GND
IN
1
6
OUT
GND
V
DD
.
511
SC-70
2
5
3
4
Table 5. Pin Descriptions
Pin
No.
1
2
Pin
Name
N/C
GND
Device Functional Considerations
Description
No Connect. This pin should be left open.
Ground pin. Ground pattern on the board
should be as wide as possible to reduce
ground impedance.
Input signal pin. DC blocking capacitor
required (100 pF typical).
Power supply pin. Bypassing is required.
Ground pin.
Divided frequency output pin. DC blocking
capacitor required (100 pF typical).
3
4
5
6
IN
V
DD
GND
OUT
The
PE3511
divides an input signal, up to a
frequency of 1500 MHz, by a factor of two thereby
producing an output frequency at half the input
frequency. To work properly with low impedance,
ground referenced interfaces, the input and output
signals (pins 3 & 6) must be AC coupled via an
external capacitor, as shown in the test circuit in
Figure 4.
The ground pattern on the board should be made
as wide as possible to minimize ground
impedance. See Figure 9 for a layout example.
Table 6. Absolute Maximum Ratings
Symbol
V
DD
P
in
T
ST
T
OP
VESD
Parameter/Conditions
Supply voltage
Input Power
Storage temperature range
Operating temperature
range
ESD voltage (Human Body
Model)
Min
Max
4.0
13
Units
V
dBm
°C
°C
V
-65
-40
150
85
2000
Absolute Maximum Ratings are those values
listed in the above table. Exceeding these values
may cause permanent device damage. Exposure
to absolute maximum ratings for extended periods
may affect device reliability.
Document No. 70-0106-03
www.psemi.com
©2005 Peregrine Semiconductor Corp. All rights reserved.
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