PE3502
Product Specification
Figure 3. Pin Configuration (Top View)
1
2
8
7
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS™ device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the rating specified in Table 3.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS™
devices are immune to latch-up.
V
DD
GND
IN
OUT
3502
DEC
3
4
6
5
GND
GND
GND
Table 2. Pin Descriptions
Pin
No.
1
2
3
Pin
Name
V
DD
IN
DEC
Device Functional Considerations
Description
Power supply pin. Bypassing is required.
Input signal pin. Should be coupled with a
capacitor (eg 15 pF)
Power supply decoupling pin. Place a ca-
pacitor as close as possible and connect
directly to the ground plane (eg 10 nF and
10 pF).
Ground pin. Ground pattern on the board
should be as wide as possible to reduce
ground impedance.
Ground pin.
Ground pin.
Divided frequency output pin. This pin
should be coupled with a capacitor (eg 100
pF).
Ground pin.
4
GND
5
6
7
GND
GND
OUT
The PE3502 takes an input signal frequency from
1500 MHz to 3500 MHz and produces an output
signal frequency one-fourth that of the supplied
input. In order for the prescaler to work properly,
several conditions need to be adhered to. It is
crucial that pin 3 be supplied with a bypass
capacitor to ground. In addition, the input and
output signals (pins 2 & 7, respectively) need to
be AC coupled via an external capacitor as shown
in the test circuit in Figure 7.
The ground pattern on the board should be made
as wide as possible to minimize ground
impedance.
8
GND
Table 3. Absolute Maximum Ratings
Symbol
V
DD
T
ST
T
OP
V
ESD
P
INMAX
Parameter/Conditions
Supply voltage
Storage temperature
range
Operating temperature
range
ESD voltage (Human
Body Model)
Maximum input power
Min
-65
-40
250
Max
4.0
150
85
Units
V
°C
°C
V
10
dBm
Absolute Maximum Ratings are those values
listed in the above table. Exceeding these values
may cause permanent device damage. Exposure
to absolute maximum ratings for extended periods
may affect device reliability.
©2005 Peregrine Semiconductor Corp. All rights reserved.
Page 2 of 7
Document No. 70-0046-04
│
UltraCMOS™ RFIC Solutions
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