AN80xx/AN80xxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN8007, AN8007M (7V type)
Parameter
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Symbol
V
O
REG
IN
REG
L
V
DIF(min)
I
Bias
RR
V
no
∆V
O
/T
a
T
j
=
25°C
V
I
=
7.5 to 13V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
I
O
=
1 to 50mA, T
j
=
25°C
V
I
=
6.8V, I
O
=
20mA, T
j
=
25°C
V
I
=
6.8V, I
O
=
50mA, T
j
=
25°C
I
O
=
0mA, T
j
=
25°C
V
I
=
8 to 10V, f
=
120Hz
f
=
10Hz to 100kHz
T
j
= −30
to
+125°C
50
Conditions
Min
6.72
Typ
7
6.5
14
31
0.07
0.13
0.7
62
120
0.35
Max
7.28
70
50
60
0.2
0.3
1.3
Unit
V
mV
mV
mV
V
V
mA
dB
µV
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
8V, I
O
=
20mA and C
O
=
10µF.
•
AN8008, AN8008M (8V type)
yp
Parameter
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Symbol
V
O
REG
IN
REG
L
V
DIF(min)
I
Bias
RR
V
no
∆V
O
/T
a
T
j
=
25°C
V
I
=
8.5 to 14V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
I
O
=
1 to 50mA, T
j
=
25°C
V
I
=
7.8V, I
O
=
20mA, T
j
=
25°C
V
I
=
7.8V, I
O
=
50mA, T
j
=
25°C
I
O
=
0mA, T
j
=
25°C
V
I
=
9 to 11V, f
=
120Hz
f
=
10Hz to 100kHz
T
j
= −30
to
+125°C
49
Conditions
Min
7.68
Typ
8
7.5
15
34
0.07
0.14
0.7
61
135
0.4
Max
8.32
80
55
65
0.2
0.3
1.3
Unit
V
mV
mV
mV
V
V
mA
dB
µV
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
9V, I
O
=
20mA and C
O
=
10µF.
•
AN8085, AN8085M
yp
(8.5V type)
Parameter
Output voltage
Line regulation
Load regulation
Minimum input/output voltage difference
Bias current
Ripple rejection ratio
Output noise voltage
Output voltage temperature coefficient
Symbol
V
O
REG
IN
REG
L
V
DIF(min)
I
Bias
RR
V
no
∆V
O
/T
a
T
j
=
25°C
V
I
=
9 to 14.5V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
I
O
=
1 to 50mA, T
j
=
25°C
V
I
=
8.3V, I
O
=
20mA, T
j
=
25°C
V
I
=
8.3V, I
O
=
50mA, T
j
=
25°C
I
O
=
0mA, T
j
=
25°C
V
I
=
9.5 to 11.5V, f
=
120Hz
f
=
10Hz to 100kHz
T
j
= −30
to
+125°C
48
Conditions
Min
8.16
Typ
8.50
8.3
16
36
0.07
0.14
0.8
60
140
0.43
Max
8.84
90
60
70
0.2
0.3
1.4
Unit
V
mV
mV
mV
V
V
mA
dB
µV
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
9.5V, I
O
=
20mA and C
O
=
10µF.
SFF00007CEB
5
PANASONIC [ PANASONIC SEMICONDUCTOR ]
