欢迎访问ic37.com |
会员登录 免费注册
发布采购

TL084CN 参数 Datasheet PDF下载

TL084CN图片预览
型号: TL084CN
PDF下载: 下载PDF文件 查看货源
内容描述: JFET输入运算放大器 [JFET INPUT OPERATIONAL AMPLIFIERS]
分类和应用: 运算放大器输入元件
文件页数/大小: 8 页 / 173 K
品牌: ONSEMI [ ON SEMICONDUCTOR ]
 浏览型号TL084CN的Datasheet PDF文件第1页浏览型号TL084CN的Datasheet PDF文件第2页浏览型号TL084CN的Datasheet PDF文件第4页浏览型号TL084CN的Datasheet PDF文件第5页浏览型号TL084CN的Datasheet PDF文件第6页浏览型号TL084CN的Datasheet PDF文件第7页浏览型号TL084CN的Datasheet PDF文件第8页  
TL081C,AC TL082C,AC TL084C,AC
ELECTRICAL CHARACTERISTICS
(VCC = 15 V, VEE = –15 V, TA = 25°C, unless otherwise noted.)
Characteristics
Input Offset Voltage (RS
10 k, VCM = 0)
TL081C, TL082C
TL084C
TL08_AC
Average Temperature Coefficient of Input Offset Voltage
RS = 50
Ω,
TA = Tlow to Thigh (Note 1)
Input Offset Current (VCM = 0) (Note 2)
TL08_C
TL08_AC
Input Bias Current (VCM = 0) (Note 2)
TL08_C
TL08_AC
Input Resistance
Common Mode Input Voltage Range
TL08_C
TL08_AC
Large Signal Voltage Gain (VO =
±10
V, RL
2.0 k)
TL08_C
TL08_AC
Output Voltage Swing (Peak–to–Peak)
(RL = 10 k)
Common Mode Rejection Ratio (RS
10 k)
TL08_C
TL08_AC
Supply Voltage Rejection Ratio (RS
10 k)
TL08_C
TL08_AC
Supply Current (Each Amplifier)
Unity Gain Bandwidth
Slew Rate (See Figure 1)
Vin = 10 V, RL = 2.0 k, CL = 100 pF
Rise Time (See Figure 1)
Overshoot (Vin = 20 mV, RL = 2.0 k, CL = 100 pF)
Equivalent Input Noise Voltage
RS = 100
Ω,
f = 1000 Hz
Channel Separation
AV = 100
Symbol
VIO
∆V
IO/∆T
IIO
IIB
ri
VICR
±10
±11
25
50
VO
CMRR
70
80
PSRR
70
80
ID
BW
SR
tr
OS
en
CS
100
100
1.4
4.0
13
0.1
10
25
120
2.8
mA
MHz
V/µs
µs
%
nV/
Hz
dB
100
100
dB
24
30
30
1012
15, –12
15, –12
150
150
28
400
200
V/mV
V
dB
V
5.0
5.0
200
100
pA
5.0
5.0
3.0
10
15
15
6.0
µV/°C
pA
Min
Typ
Max
Unit
mV
AVOL
NOTES:
1. Tlow = 0°C for TL081AC,C
Thigh = 70°C for TL081AC
0°C for
TL082AC,C
+70°C for
TL082AC,C
0°C for
TL084AC,C
+70°C for
TL084AC,C
2. Input Bias currents of JFET input op amps approximately double for every 10°C rise in Junction Temperature as shown in Figure 3. To maintain
junction temperature as close to ambient temperature as possible, pulse techniques must be used during testing.
MOTOROLA ANALOG IC DEVICE DATA
3