LP2950, LP2951, NCV2951
MAXIMUM RATINGS
(T
A
= 25°C, unless otherwise noted.)
Rating
Input Voltage
Peak Transient Input Voltage (t < 300 ms)
Power Dissipation and Thermal Characteristics
Maximum Power Dissipation
Case 751(SOIC−8) D Suffix
Symbol
V
CC
V
CC
P
D
Value
30
32
Unit
Vdc
Vdc
ÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁÁ
Á
Á Á
Internally Limited
180
45
92
6.0
160
83
105
240
−1.5 to +30
−0.3 to +30
−0.3 to +30
−40 to +125
+150
−65 to +150
W
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Case 369A (DPAK) DT Suffix (Note 1)
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Case 29 (TO−226AA/TO−92) Z Suffix
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Case 626 N Suffix
Thermal Resistance, Junction−to−Ambient
Case 846A (Micro8) DM Suffix
Thermal Resistance, Junction−to−Ambient
Feedback Input Voltage
Shutdown Input Voltage
Error Comparator Output Voltage
Operating Ambient Temperature Range
Maximum Die Junction Temperature Range
Storage Temperature Range
R
qJA
V
fb
V
sd
V
err
T
A
T
J
T
stg
°C/W
Vdc
Vdc
Vdc
°C
°C
°C
R
qJA
°C/W
R
qJA
R
qJC
°C/W
°C/W
R
qJA
R
qJC
°C/W
°C/W
R
qJA
°C/W
°C/W
R
qJC
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
3
ONSEMI [ ON SEMICONDUCTOR ]
