HEF4052B
NXP Semiconductors
Dual 4-channel analog multiplexer/demultiplexer
V
DD
S1 and S2 nY0
nZ nYn
1
V
or V
DD
SS
switch
2
E
V
SS
= V
EE
V
SS
R
L
C
L
dB
f
i
001aak657
Fig 19. Test circuit for measuring isolation (OFF-state)
0.5V
V
DD
DD
R
L
S1 and S2 nY0
nZ nYn
1
switch
2
E
G
V
SS
= V
EE
R
L
C
L
V
O
V
V
or V
SS
DD
001aak658
a. Test circuit
logic
input (Sn, E)
off
on
off
V
V
ct
O
001aaj908
b. Input and output pulse definitions
Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch
HEF4052B
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© NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 8 — 17 November 2011
14 of 22
NXP [ NXP ]
