Phycomp
Product specification
Surface-mount ceramic
multilayer capacitors
Class 2, Y5V
16/25/50 V
IEC
IEC
60384-10/
CECC 32 100
CLAUSE
60068-2
TEST
METHOD
TEST
PROCEDURE
REQUIREMENTS
4.11
Ta
solderability
zero hour test, and test after
storage (20 to 24 months) in
original packing in normal
atmosphere;
the terminations shall be
well tinned
unmounted chips completely
immersed for 2 ±0.5 s in a
solder bath at 235 ±5 °C
4.12
4.14
Na
Ca
rapid change of
temperature
preconditioning:
between minimum and
maximum temperature, 5 cycles
no visible damage
after 48 hours recovery:
∆°C/C: ≤ ±20%
damp heat,
steady state
initialization:
48 ±4 hours after UR at 40 °C
no visible damage
after 48 hours recovery:
∆°C/C: +30%/−40%
tan δ: ≤15%
for 1 hour (for initial value
measurement);
R
ins: 500 MΩ or RiCR ≥ 100 s,
500 ±12 hours at 40 °C;
90 to 95% RH; UR applied
whichever is less
damp heat;
with UR load
initialization:
48 hours after UR at 40 °C;
preconditioning:
UR at 40 °C for 1 hour, after
for 1 hour (for initial value
measurement);
500 ±12 hours at 40 °C;
90 to 95% RH; UR applied
48 hours recovery:
∆°C/C: +30%/−40%
tan δ: ≤15%
Rins: 500 MΩ or RiCR ≥ 25 s,
whichever is less
4.15
endurance
initialization:
2 × UR at 85 °C for 1 hour,
after 48 hours recovery:
∆°C/C: +30%/−40%
tan δ: ≤15%
(initial value measurement after
48 ±4 hours) ;
Rins: 1000 MΩ or RiCR ≥ 50 s,
2 × UR at 85 °C for 1000 hours
whichever is less
recovery 48 ±4 hours at room
temperature
2003 Jul 08 Rev.7
10
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YAGEO [ YAGEO CORPORATION ]
