Command Interface
M29W320DT, M29W320DB
Table 6.
Program, Erase Times and Program, Erase Endurance Cycles
Parameter
Min
Typ(1)(2)
Max(2)
Unit
Chip Erase
40
0.8
15
10
8
200(3)
6(4)
s
s
Block Erase (64 KBytes)
Erase Suspend Latency Time
Program (Byte or Word)
25(4)
µs
200(3)
150(3)
200(3)
100(3)
µs
Accelerated Program (Byte or Word)
Chip Program (Byte by Byte)
Chip Program (Word by Word)
Program/Erase Cycles (per Block)
Data Retention
µs
40
20
s
s
100,000
20
cycles
years
1. Typical values measured at room temperature and nominal voltages.
2. Sampled, but not 100% tested.
3. Maximum value measured at worst case conditions for both temperature and VCC after 100,00 program/erase cycles.
4. Maximum value measured at worst case conditions for both temperature and VCC
.
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