欢迎访问ic37.com |
会员登录 免费注册
发布采购

JS28F512P30TF 参数 Datasheet PDF下载

JS28F512P30TF图片预览
型号: JS28F512P30TF
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 32MX16, 110ns, PDSO56, LEAD FREE, TSOP-56]
分类和应用: 光电二极管内存集成电路闪存
文件页数/大小: 82 页 / 979 K
品牌: NUMONYX [ NUMONYX B.V ]
 浏览型号JS28F512P30TF的Datasheet PDF文件第1页浏览型号JS28F512P30TF的Datasheet PDF文件第2页浏览型号JS28F512P30TF的Datasheet PDF文件第3页浏览型号JS28F512P30TF的Datasheet PDF文件第4页浏览型号JS28F512P30TF的Datasheet PDF文件第6页浏览型号JS28F512P30TF的Datasheet PDF文件第7页浏览型号JS28F512P30TF的Datasheet PDF文件第8页浏览型号JS28F512P30TF的Datasheet PDF文件第9页  
P30-65nm  
1.0  
Functional Description  
1.1  
Introduction  
This document provides information about the NumonyxTM AxcellTM P30-65nm Flash  
memory and describes its features, operations, and specifications.  
P30-65nm is the latest generation of NumonyxTM AxcellTM P30 Flash memory to the  
embedded flash market segment, offered in 64-Mbit up through 2-Gbit. This document  
covers specifically 512-Mbit and 1-Gbit product information. Benefits include more  
density in less space, high-speed interface NOR device, and support for code and data  
storage. Features include high-performance synchronous-burst read mode, a  
dramatical improvement in buffer program time through larger buffer size, fast  
asynchronous access times, low power, flexible security options, and two industry-  
standard package choices.  
P30-65nm is manufactured using Numonyx™ 65nm ETOX™ X process technology.  
1.2  
Overview  
P30-65nm device provides high performance on a 16-bit data bus. Individually erasable  
memory blocks are sized for optimum code and data storage. Upon initial power-up or  
return from reset, the device defaults to asynchronous page-mode read. Configuring  
the Read Configuration Register (RCR) enables synchronous burst-mode reads. In  
synchronous burst mode, output data is synchronized with a user-supplied clock signal.  
A WAIT signal provides easy CPU-to-flash memory synchronization.  
In addition to the enhanced architecture and interface, the device incorporates  
technology that enables fast buffer program and erase operations. The device features  
a 512-word buffer to enable optimum programming performance, which can improve  
system programming throughput time significantly to 1.46MByte/s.  
Designed for low-voltage systems, the P30-65nm device supports read operations with  
VCC at 1.8V, and erase and program operations with VPP at 1.8V or 9.0V. Buffered  
Enhanced Factory Programming provides the fastest flash array programming  
performance with VPP at 9.0V, which increases factory throughput. With VPP at 1.8V,  
VCC and VPP can be tied together for a simple, ultra low power design. In addition to  
voltage flexibility, a dedicated VPP connection provides complete data protection when  
VPP VPPLK  
.
The Command User Interface is the interface between the system processor and all  
internal operations of the device. An internal Write State Machine automatically  
executes the algorithms and timings necessary for block erase and program. A Status  
Register indicates erase or program completion and any errors that may have occurred.  
A device command sequence invokes program and erase automation. Each erase  
operation erases one block. The Erase Suspend feature allows system software to  
pause an erase cycle to read or program data in another block. Program Suspend  
allows system software to pause programming to read other locations.  
P30-65nm OTP register allows unique flash device identification that can be used to  
increase system security. The individual Block Lock feature provides zero-latency block  
locking and unlocking. The P30-65nm device adds enhanced protection via Password  
Access; this new feature allows write and/or read access protection of user-defined  
blocks. In addition, the P30-65nm device also has backward compatible One-Time  
Programmable (OTP) permanent block locking security feature.  
Datasheet  
5
Aug 2009  
OrderNumber:208042-02