Absolute Maximum Ratings
(Note 1)
Supply Voltage
Output Voltage
Output Current
Storage Temperature
Lead Temperature:
SOT Package (Note 2):
Vapor Phase (60 seconds)
Infrared (15 seconds)
T
JMAX
, Maximum
Junction Temperature
+12V to −0.2V
(+V
S
+ 0.6V) to −1.0V
10 mA
−65˚C to +150˚C
ESD Susceptibility (Note 3):
Human Body Model
Machine Model
2000V
250V
Operating Ratings
(Note 1)
Specified Temperature Range:
LM50C
LM50B
Operating Temperature Range
θ
JA
(Note 4)
Supply Voltage Range (+V
S
)
T
MIN
to T
MAX
−40˚C to +125˚C
−25˚C to +100˚C
−40˚C to +150˚C
450˚C/W
+4.5V to +10V
215˚C
220˚C
150˚C
Electrical Characteristics
Unless otherwise noted, these specifications apply for V
S
= +5 V
DC
and I
LOAD
= +0.5 µA, in the circuit of
Figure 1.
Boldface
limits apply for the specified T
A
= T
J
= T
MIN
to T
MAX
; all other limits T
A
= T
J
= +25˚C, unless otherwise noted.
Parameter
Conditions
Typical
Accuracy
(Note 6)
Nonlinearity (Note 7)
Sensor Gain
(Average Slope)
Output Resistance
Line Regulation
(Note 8)
Quiescent Current
(Note 9)
Change of Quiescent
Current (Note 9)
Temperature Coefficient of
Quiescent Current
Long Term Stability (Note 10)
T
J
= 125˚C, for
1000 hours
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions.
Note 2:
See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in a current National Semicon-
ductor Linear Data Book for other methods of soldering surface mount devices.
Note 3:
Human body model, 100 pF discharged through a 1.5 kΩ resistor. Machine model, 200 pF discharged directly into each pin.
Note 4:
Thermal resistance of the SOT-23 package is specified without a heat sink, junction to ambient.
Note 5:
Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6:
Accuracy is defined as the error between the output voltage and 10mv/˚C times the device’s case temperature plus 500 mV, at specified conditions of volt-
age, current, and temperature (expressed in ˚C).
Note 7:
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device’s rated temperature
range.
Note 8:
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be com-
puted by multiplying the internal dissipation by the thermal resistance.
Note 9:
Quiescent current is defined in the circuit of
Figure 1
.
Note 10:
For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature cycled for at least 46
hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time for stress relaxation to occur. The ma-
jority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.
LM50B
Limit
(Note 5)
LM50C
Typical
Limit
(Note 5)
Units
(Limit)
T
A
= +25˚C
T
A
= T
MAX
T
A
= T
MIN
±
2.0
±
3.0
+3.0, −3.5
±
0.8
+9.7
+10.3
2000
+4.5V
≤
V
S
≤
+10V
+4.5V
≤
V
S
≤
+10V
+4.5V
≤
V
S
≤
+10V
+1.0
4000
2000
±
3.0
±
4.0
±
4.0
±
0.8
+9.7
+10.3
4000
˚C (max)
˚C (max)
˚C (max)
˚C (max)
mV/˚C (min)
mV/˚C (max)
Ω
(max)
mV/V (max)
mV/V (max)
µA (max)
µA (max)
µA (max)
µA/˚C
˚C
±
0.8
±
1.2
130
180
2.0
+2.0
±
0.8
±
1.2
130
180
2.0
±
0.08
±
0.08
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