Absolute Maximum Ratings
(Note 1)
a
12V to
b
0 2V
Supply Voltage
Output Voltage
(
a
V
S
a
0 6V) to
b
1 0V
Output Current
10 mA
b
65 C to
a
150 C
Storage Temperature
Lead Temperature
SOT Package (Note 2)
Vapor Phase (60 seconds)
215 C
Infrared (15 seconds)
220 C
T
JMAX
Maximum Junction Temperature
150 C
ESD Susceptibility (Note 3)
Human Body Model
Machine Model
2000V
200V
Operating Ratings
(Note 1)
Specified Temperature Range
LM50C
LM50B
Operating Temperature Range
i
JA
(Note 4)
Supply Voltage Range (
a
V
S
)
T
MIN
to T
MAX
b
40 C to
a
125 C
b
25 C to
a
100 C
b
40 C to
a
150 C
450 C W
a
4 5V to
a
10V
Electrical Characteristics
Unless otherwise noted
these specifications apply for V
S
e a
5 V
DC
and I
LOAD
e
a
0 5
mA
in the circuit of
Figure 1
Boldface limits apply for the specified T
A
e
T
J
e
T
MIN
to T
MAX
all other limits T
A
e
T
J
e a
25 C unless otherwise noted
LM50B
Parameter
Conditions
Typical
Limit
(Note 5)
g
2 0
g
3 0
LM50C
Typical
Limit
(Note 5)
g
3 0
g
4 0
g
4 0
g
0 8
Units
(Limit)
C (max)
C (max)
C (max)
C (max)
mV C (min)
mV C (max)
X
(max)
mV V (max)
mV V (max)
mA
(max)
mA
(max)
mA
(max)
mA
C
C
Accuracy
(Note 6)
Nonlinearity (Note 7)
Sensor Gain
(Average Slope)
Output Resistance
Line Regulation
(Note 8)
Quiescent Current
(Note 9)
Change of Quiescent
Current (Note 8)
Temperature Coefficient of
Quiescent Current
Long Term Stability (Note 10)
T
A
e a
25 C
T
A
e
T
MAX
T
A
e
T
MIN
a
3 0
b
3 5
g
0 8
a
9 7
a
10 3
a
9 7
a
10 3
2000
a
4 5V
s
V
S
s
a
10V
a
4 5V
s
V
S
s
a
10V
a
4 5V
s
V
S
s
a
10V
a
1 0
4000
g
0 8
g
1 2
2000
4000
g
0 8
g
1 2
130
180
20
a
2 0
g
0 08
130
180
20
T
J
e
125 C for
1000 hours
g
0 08
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur DC and AC electrical specifications do not apply when operating
the device beyond its rated operating conditions
Note 2
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices
Note 3
Human body model 100 pF discharged through a 1 5 kX resistor Machine model 200 pF discharged directly into each pin
Note 4
Thermal resistance of the SOT-23 package is specified without a heat sink junction to ambient
Note 5
Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)
Note 6
Accuracy is defined as the error between the output voltage and 10mv C times the device’s case temperature at specified conditions of voltage current
and temperature (expressed in C)
Note 7
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range
Note 8
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance
Note 9
Quiescent current is defined in the circuit of
Figure 1
Note 10
For best long-term stability any precision circuit will give best results if the unit is aged at a warm temperature and or temperature cycled for at least 46
hours before long-term life test begins This is especially true when a small (Surface-Mount) part is wave-soldered allow time for stress relaxation to occur The
majority of the drift will occur in the first 1000 hours at elevated temperatures The drift after 1000 hours will not continue at the first 1000 hour rate
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