DC Characteristics for ’AC Family Devices (Continued)
74AC
54AC
74AC
e
e
T
A
V
T
CC
A
e a
Symbol
Parameter
T
A
25 C
§
Units
Conditions
b
a
55 C to 125 C
b a
40 C to 85 C
(V)
§
§
§
§
Typ
Guaranteed Limits
e
I
Maximum TRI-STATE
Current
V (OE)
I
V
, V
IL IH
OZ
e
g
g
g
5.0
5.5
0.5
10.0
mA
V
V
V
, V
CC GND
I
e
V
CC
, GND
O
e
e
²
I
I
I
Minimum Dynamic
5.5
5.5
50
75
mA
mA
V
V
V
1.65V Max
3.85V Min
OLD
OHD
CC
OLD
OHD
Output Current
b
b
50
75
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
4.0
80.0
40.0
mA
or GND
²
Maximum test duration 2.0 ms, one output loaded at a time.
@
@
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V
Note : I and I
IN
.
CC
CC
@ @
for 54AC 25 C is identical to 74AC 25 C.
§ §
I
CC
DC Characteristics for ’ACT Family Devices
74ACT
74ACT
e
T
A
V
CC
e a
Symbol
Parameter
T
A
25 C
§
Units
Conditions
b
a
40 C to 85 C
(V)
§
§
Typ
Guaranteed Limits
e
OUT
V
V
V
Minimum High Level
Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
V
0.1V
IH
V
V
V
b
2.0
or V
CC
0.1V
e
Maximum Low Level
Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
V
OUT
0.1V
IL
b
or V
CC
0.1V
e b
OUT
Minimum High Level
Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
I
50 mA
OH
e
*V
IN
V
IL
or V
IH
b
b
4.5
5.5
3.86
4.86
3.76
4.76
24 mA
24 mA
V
V
I
OH
e
e
V
OL
Maximum Low Level
Output Voltage
4.5
5.5
0.001
0.001
0.1
0.1
0.1
0.1
I
50 mA
OUT
*V
IN
V
or V
IL IH
4.5
5.5
0.36
0.36
0.44
0.44
24 mA
V
I
OL
24 mA
e
e
g
g
g
g
I
I
Maximum Input Leakage Current
5.5
5.5
0.1
0.5
1.0
5.0
mA
mA
V
V
, GND
CC
IN
I
Maximum TRI-STATE
Current
V
V
V , V
IL IH
OZ
I
e
V
, GND
CC
O
e
b
2.1V
³
I
I
I
I
Maximum I /Input
CC
5.5
5.5
5.5
0.6
1.5
75
mA
mA
mA
V
V
V
V
V
CC
CCT
OLD
OHD
CC
I
e
²
Minimum Dynamic
1.65V Max
e
3.85V Min
OLD
OHD
Output Current
b
75
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
4.0
40.0
mA
or GND
*All outputs loaded; thresholds on input associated with output under test.
²
Maximum test duration 2.0 ms, one output loaded at a time.
May be measured per the JEDEC Alternate Method.
³
3
NSC [ National Semiconductor ]
