DC Characteristics for ’AC Family Devices
(Continued)
74AC
Symbol
Parameter
V
CC
(V)
T
A
e a
25 C
Typ
I
OZ
Maximum TRI-STATE
Current
Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
55
55
55
55
40
g
0 5
54AC
T
A
e
b
55 C to
a
125 C
74AC
T
A
e
b
40 C to
a
85 C
Units
Conditions
Guaranteed Limits
g
10 0
g
5 0
mA
mA
mA
mA
V
I
(OE)
e
V
IL
V
IH
V
I
e
V
CC
V
GND
V
O
e
V
CC
GND
V
OLD
e
1 65V Max
V
OHD
e
3 85V Min
V
IN
e
V
CC
or GND
I
OLD
I
OHD
I
CC
50
b
50
75
b
75
80 0
40 0
Maximum test duration 2 0 ms one output loaded at a time
Note
I
IN
and I
CC
3 0V are guaranteed to be less than or equal to the respective limit
I
CC
for 54AC 25 C is identical to 74AC 25 C
5 5V V
CC
DC Characteristics for ’ACT Family Devices
74ACT
Symbol
Parameter
V
CC
(V)
T
A
e a
25 C
Typ
V
IH
V
IL
V
OH
Minimum High Level
Input Voltage
Maximum Low Level
Input Voltage
Minimum High Level
Output Voltage
45
55
45
55
45
55
45
55
V
OL
Maximum Low Level
Output Voltage
45
55
45
55
I
IN
I
OZ
I
CCT
I
OLD
I
OHD
I
CC
Maximum Input Leakage Current
Maximum TRI-STATE
Current
Maximum I
CC
Input
Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
55
55
55
55
55
55
40
06
0 001
0 001
15
15
15
15
4 49
5 49
74ACT
T
A
e
b
40 C to
a
85 C
Units
Conditions
Guaranteed Limits
20
20
08
08
44
54
3 86
4 86
01
01
0 36
0 36
g
0 1
g
0 5
20
20
08
08
44
54
3 76
4 76
01
01
0 44
0 44
g
1 0
g
5 0
V
V
V
V
OUT
e
0 1V
or V
CC
b
0 1V
V
OUT
e
0 1V
or V
CC
b
0 1V
I
OUT
e b
50
mA
V
IN
e
V
IL
or V
IH
b
24 mA
I
OH
b
24 mA
I
OUT
e
50
mA
V
IN
e
V
IL
or V
IH
24 mA
I
OL
24 mA
V
I
e
V
CC
GND
V
I
e
V
IL
V
IH
V
O
e
V
CC
GND
V
I
e
V
CC
b
2 1V
V
OLD
e
1 65V Max
V
OHD
e
3 85V Min
V
IN
e
V
CC
or GND
V
V
V
mA
mA
mA
mA
mA
mA
15
75
b
75
40 0
All outputs loaded thresholds on input associated with output under test
Maximum test duration 2 0 ms one output loaded at a time
May be measured per the JEDEC Alternate Method
3
NSC [ NATIONAL SEMICONDUCTOR ]
