Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature (TSTG
Junction Temperature (TJ)
CDIP
)
−65˚C to +150˚C
175˚C
Recommended Operating
Conditions
Supply Voltage (VCC
)
−0.5V to +7.0V
DC Input Diode Current (IIK
)
=
VI −0.5V
−20 mA
+20 mA
Supply Voltage (VCC
)
=
VI VCC + 0.5V
’AC
2.0V to 6.0V
0V to VCC
0V to VCC
DC Input Voltage (VI)
−0.5V to VCC + 0.5V
Input Voltage (VI)
DC Output Diode Current (IOK
)
Output Voltage (VO
)
=
VO −0.5V
−20 mA
+20 mA
Operating Temperature (TA)
54AC
=
VO VCC + 0.5V
−55˚C to +125˚C
DC Output Voltage (VO
DC Output Source
)
−0.5V to to VCC + 0.5V
Minimum Input Edge Rate (∆V/∆t)
% to 70% of V
VIN from 30
CC
±
±
or Sink Current (IO
)
50 mA
50 mA
@
VCC 3.3V, 4.5V, 5.5V
125 mV/ns
DC VCC or Ground Current
per Output Pin (ICC or IGND
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT® circuits outside databook specifications.
)
DC Characteristics for ’AC Family Devices
54AC
=
Symbol
Parameter
VCC
(V)
TA −55˚C to +125˚C
Units
Conditions
Guaranteed Limits
=
VIH
Minimum High Level
Input Voltage
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
2.1
3.15
3.85
0.9
VOUT 0.1V
V
V
V
or VCC − 0.1V
=
VIL
Maximum Low Level
Input Voltage
VOUT 0.1V
1.35
1.65
0.1
or VCC − 0.1V
=
IOUT 50 µA
VOL
Maximum Low Level
Output Voltage
0.1
0.1
=
(Note 2) VIN VIL or VIH
3.0
4.5
5.5
5.5
0.5
0.5
0.5
12 mA
V
IOL 24 mA
24 mA
=
VI VCC, GND
±
IIN
Maximum Input
Leakage Current
1.0
µA
=
IOHC
IOLD
ICC
Output Leakage Current
High
5.5
5.5
5.5
−10.0
50.0
µA
mA
µA
VIN VCC
Minimum Dynamic Output
Current
VOLD = 1.65V Max (Note 3)
=
Maximum Quiescent
Supply Current
80.0
VIN VCC
or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
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