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54ABT574J/883 参数 Datasheet PDF下载

54ABT574J/883图片预览
型号: 54ABT574J/883
PDF下载: 下载PDF文件 查看货源
内容描述: 八路D型触发器具有​​三态输出 [Octal D-Type Flip-Flop with TRI-STATE Outputs]
分类和应用: 触发器逻辑集成电路
文件页数/大小: 10 页 / 326 K
品牌: NSC [ National Semiconductor ]
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Absolute Maximum Ratings (Note 1)  
Over Voltage Latchup (I/O)  
10V  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Recommended Operating  
Conditions  
Free Air Ambient Temperature  
Military  
Storage Temperature  
−65˚C to +150˚C  
−55˚C to +125˚C  
Ambient Temperature under Bias  
Junction Temperature under Bias  
Ceramic  
−55˚C to +125˚C  
Supply Voltage  
Military  
−55˚C to +175˚C  
−0.5V to +7.0V  
+4.5V to +5.5V  
(V/t)  
VCC Pin Potential to Ground Pin  
Input Voltage (Note 2)  
Minimum Input Edge Rate  
Data Input  
−0.5V to +7.0V  
50 mV/ns  
20 mV/ns  
100 mV/ns  
Input Current (Note 2)  
−30 mA to +5.0 mA  
Enable Input  
Voltage Applied to Any Output in  
the Disabled or Power-Off State  
in the HIGH State  
Clock Input  
−0.5V to 5.5V  
−0.5V to VCC  
Note 1: Absolute maximum ratings are values beyond which the device may  
be damaged or have its useful life impaired. Functional operation under these  
conditions is not implied.  
Current Applied to Output  
in LOW State (Max)  
Note 2: Either voltage limit or current limit is sufficient to protect inputs.  
twice the rated IOL (mA)  
−500 mA  
DC Latchup Source Current  
DC Electrical Characteristics  
Symbol  
Parameter  
ABT574  
Units  
VCC  
Conditions  
Min Typ Max  
VIH  
Input HIGH Voltage  
2.0  
V
V
Recognized HIGH Signal  
Recognized LOW Signal  
VIL  
Input LOW Voltage  
0.8  
=
IIN −18 mA  
VCD  
VOH  
Input Clamp Diode Voltage  
Output HIGH Voltage  
−1.2  
V
Min  
Min  
Min  
Min  
Max  
=
IOH −3 mA  
54ABT 2.5  
V
=
IOH −24 mA  
54ABT 2.0  
54ABT  
V
=
IOL 48 mA  
VOL  
IIH  
Output LOW Voltage  
Input HIGH Current  
0.55  
5
V
=
VIN 2.7V (Note 4)  
µA  
=
VIN VCC  
5
=
VIN 7.0V  
IBVI  
IIL  
Input HIGH Current Breakdown Test  
Input LOW Current  
7
µA  
µA  
Max  
Max  
=
VIN 0.5V (Note 4)  
−5  
−5  
=
VIN 0.0V  
=
VID  
Input Leakage Test  
4.75  
V
0.0  
IID 1.9 µA  
All Other Pins Grounded  
= =  
0 − 5.5V VOUT 2.7V; OE 2.0V  
IOZH  
IOZL  
IOS  
Output Leakage Current  
Output Leakage Current  
Output Short-Circuit Current  
Output High Leakage Current  
Bus Drainage Test  
50  
µA  
= =  
0 − 5.5V VOUT 0.5V; OE 2.0V  
−50 µA  
=
VOUT 0.0V  
−100  
−275 mA  
Max  
Max  
0.0  
=
VOUT VCC  
ICEX  
IZZ  
50  
µA  
=
100 µA  
VOUT 5.5V; All Other GND  
ICCH  
ICCL  
ICCZ  
Power Supply Current  
Power Supply Current  
Power Supply Current  
50  
30  
50  
µA  
mA  
µA  
Max  
Max  
Max  
All Outputs HIGH  
All Outputs LOW  
=
OE VCC  
All Others at VCC or GND  
=
VI VCC − 2.1V  
ICCT  
Additional ICC/Input  
Outputs Enabled  
Outputs TRI-STATE  
2.5 mA  
2.5 mA  
2.5 mA  
=
Enable Input VI VCC − 2.1V  
Max  
Max  
=
Outputs TRI-STATE  
Data Input VI VCC − 2.1V  
All Others at VCC or GND  
=
ICCD  
Dynamic ICC  
(Note 4)  
No Load  
mA/  
Outputs Open, OE GND,  
0.30 MHz  
One Bit Toggling (Note 3),  
50% Duty Cycle  
<
Note 3: For 8-bit toggling, I  
0.8 mA/MHz.  
CCD  
Note 4: Guaranteed, but not tested.  
3
www.national.com  
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