Absolute Maximum Ratings
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impared
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
−65˚C to +150˚C
+175˚C
−7.0V to +0.5V
V
EE
to + 0.5V
−50 mA
ESD (Note 2)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
−55˚C to +125˚C
−5.7V to −4.2V
Note 1:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND, T
C
= −55˚C to +125˚C
Symbol
V
OH
Parameter
Output HIGH Voltage
Min
−1025
−1085
V
OL
Output LOW Voltage
Max
−870
−870
Units
mV
mV
mV
mV
mV
mV
−1610
−1555
V
IH
V
IL
I
IL
I
IH
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
−1165
−870
mV
mV
mV
mV
µA
240
340
I
EE
Power Supply Current
−132
−42
mA
µA
µA
T
C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−1830 −1555
V
OHC
Output HIGH Voltage
−1035
−1085
V
OLC
Output LOW Voltage
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
−55˚C to
+125˚C
−1830 −1475
0.50
−55˚C to
+125˚C
−55˚C to
+125˚C
0˚C to
+125˚C
−55˚C
−55˚C to
+125˚C
Inputs Open
V
EE
= −4.2V to −5.7V
(Notes 3, 4, 5)
V
EE
= −4.2V
V
IN
= V
IL
(Min)
V
EE
= −5.7V
V
IN
= V
IH
(Max)
(Notes 3, 4, 5)
(Notes 3, 4, 5)
Guaranteed LOW Signal for all Inputs
(Notes 3, 4, 5, 6)
Guaranteed HIGH Signal for all Inputs
(Notes 3, 4, 5, 6)
V
IN
= V
IH
(Min)
or V
IL
(Max)
Loading with
50Ω to −2.0V
(Notes 3, 4, 5)
V
IN
= V
IH
(Max)
or V
IL
(Min)
Loading with
50Ω to −2.0V
(Notes 3, 4, 5)
−1830 −1620
Conditions
Notes
Note 3:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4:
Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5:
Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
AC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND
Symbol
f
max
Parameter
Toggle Frequency
T
C
= −55˚C
Min
400
Max
T
C
= +25˚C
Min
400
Max
T
C
= +125˚C
Min
400
Max
MHz
Units
Conditions
Notes
(Note 10)
Figures 1, 2
3
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