Absolute Maximum Ratings (Note 2)
ESD (Note 3)
≥2000V
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Case Temperature (TC)
Military
Above which the useful life may be impaired
Storage Temperature (TSTG
)
−65˚C to +150˚C
−55˚C to +125˚C
−5.7V to −4.2V
Maximum Junction Temperature (TJ)
Ceramic
Supply Voltage (VEE
)
+175˚C
−7.0V to +0.5V
VEE to +0.5V
−100 mA
Note 2: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Output Current (DC Output HIGH)
Military Version
DC Electrical Characteristics
=
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND, TC −55˚C to +125˚C
Symbol
Parameter
Min
Max
Units
TC
Conditions
Notes
VOH
Output HIGH Voltage
−1025
−870
mV
0˚C to
+125˚C
−55˚C
=
−1085
−870
mV
mV
VIN VIH (Max)
Loading with
(Notes 4, 5,
6)
VOL
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Cutoff LOW Voltage
−1830 −1620
0˚C to
or VIL (Min)
25Ω to −2.0V
+125˚C
−55˚C
−1830 −1555
−1035
mV
mV
VOHC
VOLC
VOLZ
0˚C to
+125˚C
−55˚C
=
−1085
−1610
mV
mV
VIN VIH (Min)
Loading with
(Notes 4, 5,
6)
0˚C to
or VIL (Max)
25Ω to −2.0V
+125˚C
−55˚C
−1555
−1950
mV
mV
mV
mV
µA
=
0˚C to
VIN VIH (Min)
(Notes 4, 5,
6)
=
OEN HIGH
+125˚C
−55˚C
or VIL (Max)
−1850
VIH
VIL
IIL
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
−1165
−870
−55˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
0˚C to
Guaranteed HIGH Signal
for All Inputs
(Notes 4, 5,
6, 7)
−1830 −1475
Guaranteed LOW Signal
for All Inputs
(Notes 4, 5,
6, 7)
=
VEE −4.2V
0.50
240
340
(Notes 4, 5,
6, 7)
=
VIN VIL (Min)
=
VEE −5.7V
IIH
µA
(Notes 4, 5,
6)
=
+125˚C
−55˚C
VIN VIH (Max)
µA
IEE
Power Supply Current
−55˚C to
+125˚C
Inputs Open
(Notes 4, 5,
6)
=
VEE −4.2V to −4.8V
−195
−205
−73
−73
mA
=
VEE −4.2V to −5.7V
Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 5: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 6: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 7: Guaranteed by applying specified input condition and testing V /V
.
OH OL
3
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