Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Case Temperature
Military
−55˚C to +125˚C
−5.7V to −4.2V
Storage Temperature
Maximum Junction Temperature
Ceramic
−65˚C to +150˚C
Supply Voltage (VEE
)
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
+175˚C
−7.0V to +0.5V
VEE to +0.5V
−50 mA
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Output Current (DC Output High)
ESD
≥2000V
Military Version
DC Electrical Characteristics
=
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND, TC −55˚C to +125˚C
Symbol
Parameter
Output HIGH
Voltage
Min
Max
Units
mV
mV
mV
mV
mV
MV
mV
TC
Conditions
Notes
=
VOH
−1025 −870
−1085 −870
−1035
0˚C to +125˚C
−55˚C
VIN VIH (max)
Loading with
(Notes 3, 4, 5)
or VIL (min)
25Ω to −2.0V
=
VOHC
VOLC
VOLZ
VIH
Output HIGH
Voltage
0˚C to +125˚C
−55˚C
VIN VIH (min)
Loading with
(Notes 3, 4, 5)
or VIL (max)
25Ω to −2.0V
−1085
Output LOW
Voltage
−1610
0˚C to +125˚C
−55˚C
−1555
=
Cut-Off LOW
Voltage
−1950
0˚C to +125˚C
−55˚C
VIN VIH (min)
Loading with
(Notes 3, 4, 5)
(Notes 3, 4, 5, 6)
(Notes 3, 4, 5, 6)
−1850
or VIL (max)
25Ω to −2.0V
Input HIGH
Voltage
−1165 −870
mV
mV
µA
−55˚C to +125˚C Guaranteed HIGH Signal
for All Inputs
VIL
Input LOW
Voltage
−1830 −1475
0.50
−55˚C to +125˚C Guaranteed LOW Signal
for All Inputs
=
=
IIL
Input LOW
Current
−55˚C to +125˚C VEE 4.2V, VIN VIL (min)
(Notes 3, 4, 5)
(Notes 3, 4, 5)
=
=
IIH
Input HIGH
Current
240
340
µA
µA
0˚C to +125˚C
−55˚C
VEE −5.7V, VIN VIH (max)
IEE
Power Supply
Current
Inputs Open
=
−155
−53
mA
−55˚C to +125˚C VEE −4.2V to −5.7V
(Notes 3, 4, 5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V /V
.
OH OL
3
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