5076 series
Measurement circuit
Negative Resistance
Frequency [MHz]
25 30 35
15
20
40
45
0
−200
−400
VDD
VSS
C0 = 2pF
0.1µF
Network Analyzer
(Agilent 4396B)
S-Parameter Test Set
(Agilent 85046A)
XT
VC = 1.8V
VC = 0.9V
XTN
VC
Q
−600
−800
VC = 0V
V
= 1.8V, C0 = 2pF, Ta = R.T.
DD
Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using
NPC’s original measurement jig. The values may vary with measurement jig and conditions.
Measurement circuit
Phase Noise
−60
−80
VDD
XT
0.1µF
Crystal
200Ω
0.01µF
CLOUT = 15pF
Signal Source
Analyzer
(Agilent E5052A)
XTN
VC
Q
−100
−120
−140
−160
VSS
VC = 1.8V
VC = 0.9V
VC = 0V
10
100
1,000
10,000
100,000 1,000,000 10,000,000
Offset Frequency [Hz]
V
= 1.8V, f
= 27MHz, Ta = R.T.
OUT
DD
SEIKO NPC CORPORATION —11
NPC [ NIPPON PRECISION CIRCUITS INC ]
