CF5037 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
IEE1, IEE2
A
VCC
VCC2
OUT
R1
R1
VOD,∆VOD
VOS,∆VOS
C1
Signal
Generator
R1
XOUT
OE
OUTN
GND,TEST
VOH,VOL
IIL1, IIL2
A
VIH,VIL
500mVp-p, sine wave
C1: 0.01ꢀF
R1: 49.9Ω
Note. Connect 0.01ꢀF and approximately 10ꢀF bypass capacitors between supply (V , V ) and
GND. Note that the 0.01ꢀF capacitor should have circuit wiring as short as possible.
CC CC2
Measurement Circuit 2
VCC
XIN
VCC2
OUT
IZ
A
A
IPD1
RPD1=VCC/IPD1
IZ
A
OUTN
GND
OE
Measurement Circuit 3
VCC
XIN
VCC2
OUT
Test point
Duty,VOpp,tr,tf
Test point
R1
R1
XOUT
OE
OUTN
GND
R1: 49.9Ω
Note 1. Connect 0.01ꢀF and approximately 10ꢀF bypass capacitors between supply (V , V ) and
CC CC2
GND. Note that the 0.01ꢀF capacitor should have circuit wiring as short as possible.
Note 2. The recommended differential probe used for measurement should have 5GHz analog
bandwidth, ≥ 50kΩ impedance, and < 1pF capacitive load.
Note 3. If common-mode noise becomes a problem, a DC decoupling capacitor (approximately 1000pF)
and terminating resistor matching the common-mode signal should be connected to the output
center tap.
SEIKO NPC CORPORATION —9
NPC [ NIPPON PRECISION CIRCUITS INC ]
