CF5037 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
A
I
EE1,
I
EE2
VCC
VCC2
OUT
R1
V
OD
,∆V
OD
Signal
Generator
R1
C1
XOUT
OE
OUTN
GND,TEST
I
IL1,
I
IL2
R1
V
OH
,V
OL
V
OS
,∆V
OS
A
V
IH
,V
IL
500mVp-p, sine wave
C1: 0.01µF
R1: 49.9Ω
Note. Connect 0.01µF and approximately 10µF bypass capacitors between supply (V
CC
, V
CC2
) and
GND. Note that the 0.01µF capacitor should have circuit wiring as short as possible.
Measurement Circuit 2
A
I
PD1
R
PD1
=V
CC
/I
PD1
VCC
XIN
VCC2
OUT
I
Z
A
I
Z
OUTN
OE
GND
A
Measurement Circuit 3
VCC
XIN
VCC2
OUT
R1
Duty,V
Opp
,t
r
,t
f
Test point
XOUT
OE
R1
OUTN
GND
Test point
R1: 49.9Ω
Note 1. Connect 0.01µF and approximately 10µF bypass capacitors between supply (V
CC
, V
CC2
) and
GND. Note that the 0.01µF capacitor should have circuit wiring as short as possible.
Note 2. The recommended differential probe used for measurement should have 5GHz analog
bandwidth,
≥
50kΩ impedance, and
<
1pF capacitive load.
Note 3. If common-mode noise becomes a problem, a DC decoupling capacitor (approximately 1000pF)
and terminating resistor matching the common-mode signal should be connected to the output
center tap.
SEIKO NPC CORPORATION —9
NPC [ NIPPON PRECISION CIRCUITS INC ]
