CF5036 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement Circuit 3
A
I
EE1,
I
EE2
A
VCC
VCC2
OUT
R1
V
T
XOUT
R1
OE
R1
OUTN
GND,TEST
I
IL1,
I
IL2
Test point
OE
OUTN
GND
2V
Test point
I
PD1
R
PD1
=V
CC
/I
PD1
I
Z
VCC
XIN
VCC2
OUT
I
Z
A
Signal
Generator
C1
A
A
V
IH
,V
IL
Measurement Circuit 4
500mVp-p, sine wave
C1: 0.01µF
R1: 49.9Ω
Note. Connect 0.01µF and approximately 10µF bypass capacitors
between supply (V
CC
, V
CC2
) and GND. Note that the 0.01µF
capacitor should have circuit wiring as short as possible.
VCC
XIN
VCC2
OUT
R1
2V
V
T
Measurement Circuit 2
XOUT
OE
R1
OUTN
GND
Duty1,Duty2,V
Opp
,t
r
,t
f
VCC
VCC2
OUT
R1
2V
V
T
XIN
R1
OUTN
GND,TEST
V
OH
,V
OL
R1: 49.9Ω
Note. Connect 0.01µF and approximately 10µF bypass capacitors
between supply (V
CC
, V
CC2
) and GND. Note that the 0.01µF
capacitor should have circuit wiring as short as possible.
R1: 49.9Ω
XIN = HIGH: OUT = HIGH
XIN = LOW : OUT = LOW
SEIKO NPC CORPORATION —9