5026 series
MEASUREMENT CIRCUITS
Measurement cct 1
Measurement cct 4
C1
VDD
VDD
Signal
Generator
XT
XT
VDD
Q
Q
RUP1 =
RUP2 =
IPR
XTN
INHN
XTN
INHN
(VPR = VSS)
R1
VSS
VSS
VDD VPR
R2
IPR
V
VPR
(VPR = 0.7VDD)
IPR
VDD
VOH
0V
A
Q output
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
R2: 5026AL×
: 412Ω (2.5V operation)
575Ω (3.0V operation)
Measurement cct 5
5026BL1, ML× : 206Ω (2.5V operation)
287Ω (3.0V operation)
Measurement cct 2
VDD
VDD
Rf =
XT
IRf
Q
VDD
Rf 2 =
XTN
INHN
IRf
VSS
IZ, IOL
VDD
IZ
A
XT
Q
A
IRf
XTN
INHN
VSS
VOH
VOL
V
Measurement cct 6
C1
VDD
Signal
Generator
Measurement cct 3
XT
Q
XTN
INHN
R1
VSS
IDD
IST
A
VDD
XT
X'tal
Q
XTN
INHN
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
VSS
Load cct 1
Q output
CL
(Including probe
capacitance)
SEIKO NPC CORPORATION —14
NPC [ NIPPON PRECISION CIRCUITS INC ]
