CF5020 series
3V operation
= 2.7 to 3.6V, V = 0V, Ta = −40 to +85°C unless otherwise noted.
V
DD
SS
Rating
Parameter
Symbol
Condition
Unit
min
2.2
typ
2.4
0.3
–
max
–
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
V
Q: Measurement cct 1, V = 2.7V, I = 8mA
DD OH
V
V
OH
V
Q: Measurement cct 2, V = 2.7V, I = 8mA
DD OL
–
0.4
–
OL
V
INHN
INHN
0.7V
V
IH
DD
V
–
–
–
–
0.3V
V
IL
DD
V
V
= V
= V
–
10
10
µA
µA
OH
DD
Output leakage current
I
Q: Measurement cct 2, INHN = LOW
Z
–
OL
SS
C = 15pF
L
f = 90MHz
–
–
–
–
–
–
–
20
25
25
40
30
40
40
50
60
mA
mA
mA
mA
mA
mA
mA
CF5020ALA
C = 30pF
L
f = 90MHz
C = 15pF
L
f = 125MHz
60
CF5020ALB
Measurement cct 3,
load cct 1,
INHN = open
C = 30pF
L
f = 125MHz
Current consumption
I
100
70
DD
C = 15pF
L
f = 135MHz
CF5020ALC
C = 30pF
L
f = 125MHz
100
100
C = 15pF
L
f = 170MHz
CF5020ALD
Standby current
I
Measurement cct 3, INHN = LOW
–
–
4
5
µA
MΩ
kΩ
kΩ
kΩ
kΩ
kΩ
kΩ
Ω
ST
R
2
8
UP1
INHN pull-up resistance
Measurement cct 4
R
50
100
2.5
4.5
3.3
2.2
100
200
57
57
57
10
4
150
2.88
5.18
3.80
2.53
150
230
65.6
65.6
65.6
11.5
4.60
3.45
1.15
1.15
8.05
3.45
3.45
5.75
UP2
CF5020ALA
CF5020ALB
CF5020ALC
CF5020ALD
2.12
3.82
2.80
1.87
50
Design value.
A monitor pattern on a wafer is tested.
AC feedback resistance
DC feedback resistance
R
f1
R
Measurement cct 5
f2
CF5020ALA
CF5020ALB
CF5020ALC
CF5020ALD
170
48.4
48.4
48.4
8.5
Ω
Oscillator amplifier output
resistance
Design value.
A monitor pattern on a wafer is tested.
R
D
Ω
Ω
AC feedback capacitance
C
Design value. A monitor pattern on a wafer is tested.
CF5020ALA
pF
pF
pF
pF
pF
pF
pF
pF
pF
f
3.40
2.55
0.85
0.85
5.95
2.55
2.55
4.25
CF5020ALB
CF5020ALC
CF5020ALD
CF5020ALA
CF5020ALB
CF5020ALC
CF5020ALD
3
Design value.
A monitor pattern on a wafer is tested.
C
G
1
1
Built-in capacitance
7
3
Design value.
A monitor pattern on a wafer is tested.
C
D
3
5
NIPPON PRECISION CIRCUITS INC.—6
NPC [ NIPPON PRECISION CIRCUITS INC ]
