CF5019 series
MEASUREMENT CIRCUITS
Measurement cct 1
Measurement cct 4
C1
VDD
VDD
Signal
Generator
XT
XT
VDD
Q
Q
RUP1 =
RUP2 =
IPR
XTN
INHN
XTN
INHN
(VPR = VSS)
R1
VSS
VSS
VDD VPR
R2
IPR
V
VPR
(VPR = 0.7VDD)
IPR
VDD
VOH
0V
A
Q output
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
R2: 219Ω (2.5V operation)
275Ω (3.0V operation)
Measurement cct 5
Measurement cct 2
VDD
XT
VDD
Rf =
IZ, IOL
Q
IRf
VDD
XT
XTN
INHN
IZ
VSS
Q
A
A
XTN
INHN
VSS
V
V
OH
OL
V
IRf
Measurement cct 6
Measurement cct 3
C1
VDD
Signal
XT
Generator
Q
IDD
IST
XTN
INHN
R1
A
VSS
VDD
XT
X'tal
Q
XTN
INHN
VSS
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
Load cct 1
Q output
CL
(Including probe
capacitance)
SEIKO NPC CORPORATION —10