CF5015 series
MEASUREMENT CIRCUITS
Measurement cct 1
Measurement cct 4
Signal
Generator
R1
C1
XT
XTN
INHN
R3
VDD
Q
VSS
R2
When
measuring
V
OL
XT
XTN
INHN
VDD
Q
R
UP1
=
V
DD
I
PR
(V
PR
= V
SS
)
When
measuring
V
OH
VSS
V
Q output
V
DD
V
OH
0V
V
DD
V
OL
0V
V
PR
I
PR
R
UP2
= V
DD
V
PR
I
PR
(V
PR
=
0.7V
DD
)
A
Q output
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
R2: 413Ω (2.5V operation)
525Ω (3V operation)
488Ω (5V operation)
R3: 462Ω (2.5V operation)
575Ω (3V operation)
512Ω (5V operation)
Measurement cct 5
XT
VDD
Q
R
f
=
V
DD
I
Rf
Measurement cct 2
XTN
INHN
I
Z
XT
XTN
INHN
VDD
Q
VSS
I
Z
VSS
A
I
Rf
A
V
V
OL
V
OH
Measurement cct 6
Signal
Generator
C1
XT
R1
XTN
INHN
VDD
Q
VSS
Measurement cct 3
A
XT
X'tal
XTN
INHN
VDD
I
DD
I
ST
Q
VSS
2Vp-p, 10MHz sine wave input signal
C1: 0.001µF
R1: 50Ω
Load cct 1
Q output
C
L
(Including probe
capacitance)
SEIKO NPC CORPORATION —8