SM5010 series
5010FH× series
5V operation/Duty level: CMOS
V
= 4.5 to 5.5V, V = 0V
SS
DD
30 ≤ f ≤ 50MHz: Ta = −20 to +80°C, 50 < f ≤ 60MHz: Ta = −15 to +75°C unless otherwise noted.
Rating
Parameter
Output rise time
Output fall time
Symbol
Condition
Unit
ns
min
–
typ
4
max
8
t
C = 15pF
L
r1
Measurement cct 6, load cct 1,
0.1V to 0.9V
DD
DD
t
C = 50pF
L
–
11
4
21
8
r2
t
C = 15pF
L
–
f1
Measurement cct 6, load cct 1,
0.9V to 0.1V
ns
DD
DD
t
C = 50pF
L
–
11
–
21
55
60
100
100
f2
f = 50MHz
f = 60MHz
45
40
–
Measurement cct 6, load cct 1,
= 5.0V, Ta = 25°C, C = 15pF
1
Output duty cycle
Duty
%
V
DD
L
–
Output disable delay time
Output enable delay time
t
–
ns
ns
PLZ
Measurement cct 7, load cct 1, V = 5.0V, Ta = 25°C,
DD
C = 15pF
L
t
–
–
PZL
1. The duty cycle characteristic is checked the sample chips of each production lot.
5010HN× series
5V operation/Duty level: CMOS
V
= 4.5 to 5.5V, V = 0V, Ta = −40 to +85°C unless otherwise noted.
SS
DD
Rating
typ
Parameter
Symbol
Condition
Unit
min
–
max
3.0
6.0
3.0
6.0
t
C = 15pF
L
1.5
r1
Measurement cct 6, load cct 1,
0.1V to 0.9V
Output rise time
ns
DD
DD
t
C = 50pF
L
–
3.0
r2
t
C = 15pF
L
–
1.5
f1
Measurement cct 6, load cct 1,
0.9V to 0.1V
Output fall time
ns
%
DD
DD
t
C = 50pF
L
–
3.0
f2
Measurement cct 6, load cct 1, V = 5.0V, Ta = 25°C,
1
DD
Output duty cycle
Duty
45
–
55
C = 50pF, f = 50MHz
L
Output disable delay time
Output enable delay time
t
–
–
–
–
100
100
ns
ns
PLZ
Measurement cct 7, load cct 1, V = 5.0V, Ta = 25°C,
L
DD
C = 15pF
t
PZL
1. The duty cycle characteristic is checked the sample chips of each production lot.
SEIKO NPC CORPORATION —20