WF5028 series
TYPICAL PERFORMANCE
The following characteristics measured using the crystal below. Note that the characteristics will vary with the
crystal used.
ꢀ Crystal used for measurement
ꢀ Crystal parameters
Parameter
C0 [pF]
f
= 48MHz
1.6
C1
L1
R1
O
R1 [Ω]
12
C0
Current Consumption
Negative Resistance
5
4
Frequency [MHz]
0
0
20
40
60
80
100
CL = 15pF
−200
−400
3
2
1
0
C0 = 2pF
−600
No load
1.5
C0 = 1pF
C0 = 0pF
−800
0.5
1.0
2.0
−1000
V
DD [V]
5028×1, f
= 48MHz, f
= 48MHz, Ta = 25°C
5028×1, V = 0.9V, Ta = 25°C
DD
OSC
OUT
Characteristics are measured with a capacitance C0, representing
the crystal equivalent circuit C0 capacitance, connected between
the XT and XTN pins. Measurements are performed with Agilent
4396B using the NPC test jig. Characteristics may vary with
measurement jig and measurement conditions.
Frequency Deviation by Supply Voltage
Change
Drive Level
12
200
8
f = 48MHz
150
f = 48MHz
4
0
100
50
0
−4
−8
−12
0.5
1.0
1.5
2.0
0.5
1.0
1.5
2.0
VDD [V]
VDD [V]
5028×1, C = 15pF, 1.2V standard, Ta = 25°C
5028×1, f
= 48MHz, Ta = 25°C
L
OSC
SEIKO NPC CORPORATION —11