NJM2549
Test Circuit 5 for Demodulated Signal Frequency Characteristics (Detected Output: S-Curve)
V+
AF OUT
FET Probe
RSSI OUT
Spectrum
Analyzer
V
T1
R2
2.4k
C6
82p
C7
0.01u
C4
100p
C5
3p
10
9
8
7
6
QUAD
DET
IF AMP
RSSI
1
2
3
4
5
C1
C2
C3
0.01u
0.01u
0.01u
C9
10u
C8
0.01u
R1
51
Zo=50
IF IN
Test Circuit 6 for Demodulated Signal Frequency Characteristics (Detected Output: N-Curve)
V+
AF OUT
FET Probe
RSSI OUT
Spectrum
Analyzer
V
T1
R2
360
C6
82p
C7
0.01u
C4
100p
C5
3p
10
9
8
7
6
QUAD
DET
IF AMP
RSSI
1
2
3
4
5
C1
C2
C3
0.01u
0.01u
0.01u
C9
10u
C8
0.01u
R1
51
Zo=50
IF IN
T1:4CJH(Sample No.:080293006)
SAGAMI ELEC CO., LTD. (Japan)
Ver.2010-06-24
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