8-Channel Strain Gage Modules
NI 9235, NI 9236
• 8 channels, simultaneous
quarter-bridge inputs
• 10 kS/s/ch sample rate
• 1000 V
rms
transient isolation
• 24-bit resolution
• Multiple module synchronization
within the same chassis
• Ability to program for USB with the
easy-to-use NI-DAQmx driver
• Built-in excitation
• Built-in shunt calibration
Recommended Software
• LabVIEW
• LabWindows
™
/CVI
• Measurement Studio
NI-DAQmx Compatible Software
• LabVIEW SignalExpress
• Visual Studio .NET
• ANSI C/C++/C#
Connectivity
• NI 9235/9236 modules are shipped
with everything needed to connect
signals out of the box
• Backshell is available for added
strain relief and cable protection
C Series Compatibility
• NI CompactDAQ (NI-DAQmx)
• CompactRIO (NI-RIO)
• R Series expansion chassis (NI-RIO)
Module
NI 9237
NI 9235
NI 9236
C Series Compatibility
CompactRIO, NI CompactDAQ, USB, Wi-Fi
CompactRIO, NI CompactDAQ, USB Carrier
CompactRIO, NI CompactDAQ, USB Carrier
Channels
4
8
8
Resolution
24 bits
24 bits
24 bits
Excitation
Up to 10 V or external
2.0 V
3.3 V
Bridge Completion
Full, half, quarter (120, 350
Ω)
Quarter (120
Ω)
Quarter (350
Ω)
Sample Rate (kS/s/ch)
50
10
10
Simultaneous
Table 1. NI C Series Strain Gage Module Selection Guide
Overview and Applications
NI 9235 and 9236 C Series analog input modules are ideal for medium-
to high-channel-count strain measurement applications such as structural
or impact test. You can use these modules in the 8-slot NI CompactDAQ
USB chassis for a plug-and-play, portable setup that can measure up
to 64 channels in a single chassis. All channels of all C Series modules
synchronize in the backplane.
For structural health monitoring or other applications that require
embedded logging or processing, you can use NI 9235/9236 modules
in 4- and 8-slot NI CompactRIO chassis, which include an onboard
processor and storage media. CompactRIO has an extended operational
temperature range as well as rugged shock and vibration specifications
and a Class 1, Division 2 hazardous location rating.
The small size and high performance of C Series hardware make it
a good choice for compact test systems with multiple measurement
types. You can add and synchronize new measurements by installing
additional modules in the chassis. Common systems that use strain
gages range from small engine test cells to mountain bike frame tests
to in-vehicle chassis and suspension tests. The high bandwidth available
in C Series hardware like NI CompactDAQ and CompactRIO delivers high-
speed measurements such as dynamic strain, acceleration, and sound.
You can mix these measurements with lower-speed measurements such
as temperature in the same system with the same program.
High Throughput with Multiple ADCs
The use of multiple analog-to-digital converters (ADCs) in a single module
has two main benefits. First, the overall sample rate available to each
channel is dramatically increased. This is important when conducting
high-speed tests, such as impact or fracture tests, over multiple channels.
The other main advantage is the elimination of phase offset between
channels when sampling at higher speeds.
Elimination of Unwanted Signals with
Built-In Antialias Filters
For dynamic measurements, it is important to filter out unwanted signals.
Without some form of filtering, unwanted high-frequency signals can alias
the signal you are measuring, causing incorrect readings. To prevent
these phenomena, NI 9235/9236 modules have built-in antialiasing
filters that adjust to your selected sample rate and ensure that the
signal you are measuring has no interference from signals beyond the
Nyquist frequency.
Mixed-Measurement Test System
NI 9235/9236 modules are just two in a collection of more than 50
C Series modules for measurements such as temperature, acceleration,
voltage, current, sound, pressure, load, force, torque, and digital I/O.
You can easily synchronize every C Series module you use in a chassis
to acquire data from all channels at the same rate and at the same time.
NI [ NATIONAL INSTRUMENTS CORPORATION ]
