100 and 50 MHz, Programmable-Voltage
Digital Waveform Generator/Analyzers
NI 655x
• 100 MHz maximum clock rate
• -2.0 to 5.5 V programmable voltage
levels in 10 mV steps
• 20 channels with per-channel, per-cycle
bidirectional control
• 1, 8, or 64 Mb/channel onboard memory
• Real-time hardware comparison of
acquired data
• Complex triggering and pattern
sequencing
• Interactive waveform and script
editor software
• Synchronization and Memory Core
(SMC) for tight synchronization with
other SMC-based devices
Operating Systems
• Windows 2000/NT/XP
• LabVIEW Real-Time
Recommended Software
• LabVIEW
• LabWindows/CVI
• SignalExpress
Driver and Editing Software
(included)
• NI-HSDIO driver
• Script Editor
• Digital Waveform Editor
(included with 8 and
64 Mb/channel models)
Calibration
• NIST traceable
• 2-year external calibration cycle
Product
NI 6552
NI 6551
Platform
PCI, PXI
PCI, PXI
Channels
20
20
Maximum Clock
Rate (MHz)
100
50
Voltage Levels
Programmable, 10 mV steps
Programmable, 10 mV steps
Memory
Scripting
Programmable
(Mb/channel) (Linking/Looping)
Data Delay
1, 8, or 64
1, 8, or 64
Per-Cycle
Tristate
Hardware
Comparison
Table 1. NI 655x Selection Guide
Overview
The National Instruments 6552 and
6551 are 100 and 50 MHz digital
Mixed-signal design validation and test
waveform generator/analyzers,
Interfacing to digital electronics
respectively, for characterizing,
Aerospace/Defense
validating, and testing digital
Subsystem emulation
Bit error rate tester (BERT)
electronics. These modules feature
Communications
20 channels with per-channel,
Multimedia chipset emulation
per-cycle direction control and deep
Consumer Electronics
onboard memory with triggering and
CMOS and CCD imaging sensors
pattern sequencing. You can program
Digital display tests
the voltage levels on NI 655x devices
with 10 mV resolution. You can use them with the NI Digital Waveform
Editor, an interactive software tool for creating, editing, and importing
digital waveforms. With the SMC, you can create mixed-signal test
systems with digitizers, arbitrary waveform generators, and other digital
waveform generator/analyzers, or you can synchronize multiple digital
waveform devices to build high-channel-count test systems.
Applications
Semiconductor
Design High-Performance Tests
For building high-performance stimulus-response systems, the NI 655x
devices include:
• A sophisticated timing engine to adjust for the timing parameters
of the device under test
• Programmable voltage levels for testing multiple devices or
characterizing a single device under changing conditions
• Per-cycle tristate for bidirectional communication
• A versatile memory architecture for maximum flexibility of waveform
and scripting memory
The hardware architecture is designed to preserve high signal quality,
and an eye diagram of the PXI-6552 generation is shown in Figure 1.
You can use the internal clock or an external clock, such as from the
NI PXI-5404, through the front panel. You can also shift the data
generated, data acquired, and exported sample clock relative to the
onboard clock for clock frequencies above 25 MHz, which is critical to
adjust for propagation delays and setup-and-hold times in the device
under test.
Programmable voltage levels are needed when testing different
devices or when characterizing how a given device performs under
changing conditions. With NI 655x devices, the high and low levels for
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