N04Q16yyC2B
NanoAmp Solutions, Inc.
Timing Test Conditions
Advance Information
Item
0.1VCC to 0.9 VCC
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
5ns
0.5 VCC
CL = 30pF
0 to +70oC
Operating Temperature
Timing
-70
-150
Units
Item
Symbol
Min.
Max.
Min.
Max.
tRC
tAA
Read Cycle Time
70
150
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Address Access Time
70
35
70
35
70
150
75
tAAP
tCO
tOE
Page Mode Address Access Time
Chip Enable to Valid Output
150
75
Output Enable to Valid Output
Byte Select to Valid Output
tLB, UB
t
150
tLZ
Chip Enable to Low-Z output
Output Enable to Low-Z Output
Byte Select to Low-Z Output
Chip Disable to High-Z Output
Output Disable to High-Z Output
Byte Select Disable to High-Z Output
Output Hold from Address Change
10
5
10
5
tOLZ
tLBZ, UBZ
tHZ
tOHZ
LBHZ, tUBHZ
tOH
t
10
0
10
0
20
20
20
20
20
20
0
0
t
0
0
10
10
ns
tWC
tCW
tAW
Write Cycle Time
Chip Enable to End of Write
Address Valid to End of Write
Byte Select to End of Write
Write Pulse Width
70
50
50
50
40
0
150
120
120
120
100
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tLBW, UBW
tWP
tAS
t
Address Setup Time
tWR
tWHZ
tDW
tDH
Write Recovery Time
0
0
Write to High-Z Output
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
20
20
40
0
100
0
tOW
5
5
ns
Stock No. 23451-B 2/06
The specification is ADVANCE INFORMATION and subject to change without notice.
7
NANOAMP [ NANOAMP SOLUTIONS, INC. ]
