NanoAmp Solutions, Inc.
Timing Test Conditions
N04L163WC2A
Item
0.1VCC to 0.9 VCC
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
5ns
0.5 VCC
CL = 30pF
-40 to +85 oC
Operating Temperature
Timing
-70
Units
Item
Symbol
2.3 - 2.65 V
Min. Max.
2.7 - 3.6 V
Min.
Max.
tRC
tAA
tCO
tOE
Read Cycle Time
Address Access Time
85
70
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
85
85
30
85
70
70
25
70
Chip Enable to Valid Output
Output Enable to Valid Output
Byte Select to Valid Output
t
LB, tUB
tLZ
Chip Enable to Low-Z output
Output Enable to Low-Z Output
Byte Select to Low-Z Output
Chip Disable to High-Z Output
Output Disable to High-Z Output
Byte Select Disable to High-Z Output
Output Hold from Address Change
10
5
10
5
tOLZ
tLBZ, tUBZ
tHZ
10
0
10
0
20
20
20
20
20
20
tOHZ
0
0
t
LBHZ, tUBHZ
tOH
0
0
10
10
tWC
tCW
Write Cycle Time
Chip Enable to End of Write
Address Valid to End of Write
Byte Select to End of Write
Write Pulse Width
85
50
50
50
40
0
70
50
50
50
40
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tAW
tLBW, tUBW
tWP
tAS
Address Setup Time
tWR
Write Recovery Time
0
0
tWHZ
tDW
Write to High-Z Output
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
20
20
40
0
40
0
tDH
tOW
5
5
ns
(DOC# 14-02-017 REV G ECN# 01-1268)
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
6
NANOAMP [ NANOAMP SOLUTIONS, INC. ]
