ES62UL256 Family
NanoAmp Solutions
TABLE 5: Capacitance
Item
Symbol
Test Condition
Min
Max
5
Unit
pF
Input Capacitance
I/O Capacitance
C
V
V
= 0V
= 0V
IN
IN
IN
C
5
pF
I/O
TABLE 6: Timing Test Conditions (Over the Specified Temperature Range)
Item
Input Pulse Level
0.1V to 0.9V
CC
CC
Input Rise and Fall Time
5nS
Input and Output Timing Reference Levels
0.5V
CC
Output Load
CL = 50pF
TABLE 7: Read Cycle Timing
3.0-3.6V
-25
Item
Symbol
Min/Max
1.5V
Units
-45
45
45
45
15
5
Read Cycle Time
t
Min
Max
Max
Max
Min
Min
200
200
200
60
25
25
25
10
5
ns
ns
ns
ns
ns
ns
RC
Address Access Time
t
AA
CE
OE
Chip Enable Access Time
Output Enable to Valid Output
Chip Enable to Low-Z output
Output Enable to Low-Z Output
t
t
t
20
LZ
t
20
5
5
OLZ
Min
Max
Min
Max
Min
0
0
15
0
0
10
0
Chip Enable to High-Z Output
t
ns
HZ
50
0
Output Disable to High-Z Output
Output Hold from Address Change
t
ns
ns
OHZ
50
20
15
5
10
5
t
OH
TABLE 8: Write Cycle Timing
3.0-3.6V
Item
Symbol
Min/Max
1.5V
Unit
-45
-25
Write Cycle Time
t
t
Min
Min
Min
Min
Min
Min
200
100
100
0
45
35
35
0
25
20
20
0
ns
ns
ns
ns
ns
ns
WC
Chip Enable to End of Write
Address Valid to End of Write
Address Set-Up Time
Write Pulse Width
CW
t
AW
t
AS
WP
WR
t
75
0
25
0
15
0
Write Recovery Time
t
Min
Max
Min
0
0
0
Write to High-Z Output
t
ns
WHZ
60
60
20
25
15
15
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
t
ns
ns
ns
DW
t
Min
Min
0
0
5
0
5
DH
t
20
OW
Stock No. 23003-03 4/99
4
NANOAMP [ NANOAMP SOLUTIONS, INC. ]
