■ Specifications and Test Methods
No Item
15 Durability
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-15%
DF≦0.05
More than 10MΩ･μF
No defects or abnormalities.
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Voltage treatment:Apply the test voltage at the test temperature for 1hour and then let sit for
24+/-2hours at room temperature, then measure.
Maximum Operating Temperature +/-3℃
1000+48/-0h
I.R.
Voltage proof
Test Temperature
Test Time
Test Voltage
120% of the rated voltage
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
GRM55DR72J224KW01-05B
4
MURATA [ muRata ]
