Item
Specification
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
No.
15 High
Appearance No defects or abnormalities.
40+/-2℃
Temperature
High Humidity
(Steady)
Test Temperature :
Test Humidity :
Test Time :
Capacitance Within +/-12.5%
Change
90%RH to 95%RH
500+/-12h
Q or D.F.
DF:0.2 max.
Test Voltage :
Charge/Discharge Current :
Rated Voltage
50mA max.
I.R.
More than 500MΩ or 12.5Ω･F (Whichever is smaller)
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Pre-treatment :
Post-treatment :
16 Durability
Appearance No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Test Time :
Test Voltage :
Maximum Operating Temperature+/-3℃
1000+/-12h
150% of the rated voltage
50mA max.
Capacitance Within +/-12.5%
Change
Charge/Discharge Current :
Q or D.F.
DF:0.2 max.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
I.R.
More than 1000MΩ or 25Ω･F (Whichever is smaller)
Pre-treatment :
Post-treatment :
GRM31CB31C226ME15-01A
MURATA [ muRata ]
