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GRM2195C1H472JA01D 参数 Datasheet PDF下载

GRM2195C1H472JA01D图片预览
型号: GRM2195C1H472JA01D
PDF下载: 下载PDF文件 查看货源
内容描述: 片状独石陶瓷电容器 [Chip Monolithic Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器固定电容器
文件页数/大小: 13 页 / 204 K
品牌: MURATA [ MURATA MANUFACTURING CO., LTD. ]
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Please read rating and
!CAUTION
(for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
!Note
•Please read rating and
!CAUTION
(for storage, operating, rating, soldering, mounting and handling) in this PDF catalog to prevent smoking and/or burning, etc.
•This catalog has only typical specifications. Therefore,thereareno space for detailed specifications. Therefore, please approve our productsheet for product specificaions approval sheet for product specifications before ordering.
This catalog has only typical specifications because you is requested to approve our product specifications or to transact the approval specifications or transact the before ordering.
C02E10.pdf 04.1.20
GRM Series Specifications and Test Methods
Continued from the preceding page.
Specifications
No.
Item
Temperature
Compensating Type
Test Method
High Dielectric Type
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
Capacitance
Change
No marking defects
Within
T5%
or
T0.5pF
(Whichever is larger)
R6, R7 : Within
T12.5%
E4, F5 : Within
T30%
[R6, R7]
W.V. : 25Vmin. : 0.05max.
W.V. : 16/10V : 0.05max.
W.V. : 6.3V
0.075max. (CF3.3µF)
0.125max. (CU3.3µF)
[E4]
W.V. : 25Vmin. : 0.05max.
[F5]
W.V. : 25Vmin.
: 0.075max. (CF0.10µF)
: 0.125max. (CU0.10µF)
W.V. : 16V/10V : 0.15max.
W.V. : 6.3Vmax. : 0.2max.
4
16
Humidity
Steady
State
Q/D.F.
30pF and over : QU350
10pF and over
30pF and below :
QU275W5C/2
10pF and below :
QU200W10C
C : Nominal Capacitance (pF)
Let the capacitor sit at 40T2D and 90 to 95% humidity for
500T12 hours.
Remove and let sit for 24T2 hours (temperature compensating
type) or 48T4 hours (high dielectric constant type) at room tem-
perature, then measure.
I.R.
Dielectric
Strength
More than 1,000MΩ or 50Ω • F (Whichever is smaller)
No failure
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance
No marking defects
R6, R7 : Within
T12.5%
E4 : Within
T30%
F5 : Within
T30%
[W.V. : 10Vmax.]
F5 : Within
W30/Y40%
[R6, R7]
W.V. : 25Vmin. : 0.05max.
W.V. : 16/10V : 0.05max.
W.V. : 6.3V
0.075max. (CF3.3µF)
0.125max. (CU3.3µF)
[E4]
W.V. : 25Vmin. : 0.05max.
[F5]
W.V. : 25Vmin.
: 0.075max. (CF0.10µF)
: 0.125max. (CU0.10µF)
W.V. : 16V/10V : 0.15max.
W.V. : 6.3Vmax. : 0.2max.
Apply the rated voltage at 40T2D and 90 to 95% humidity for
500T12 hours. Remove and let sit for 24T2 hours (temperature
compensating type) or 48T4 hours (high dielectric constant
type) at room temperature, then measure. The charge/discharge
current is less than 50mA.
#Initial
measurement for F5/10V max.
Apply the rated DC voltage for 1 hour at 40T2D.
Remove and let sit for 48T4 hours at room temperature.
Perform initial measurement.
Capacitance
Change
Within
T7.5%
or
T0.75pF
(Whichever is larger)
17
Humidity
Load
Q/D.F.
30pF and over : QU200
30pF and below :
QU100+10C/3
C : Nominal Capacitance (pF)
I.R.
Dielectric
Strength
More than 500MΩ or 25Ω • F (Whichever is smaller)
No failure
Continued on the following page.
25