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C02E10.pdf 04.1.20
GRM Series Specifications and Test Methods
Specifications
No.
Item
Temperature
Compensating Type
Test Method
High Dielectric Type
R6 :
Y55
to
W85D
R7 :
Y55
to
W125D
E4 :
W10
to
W85D
F5 :
Y30
to
W85D
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
P-P
or V
O-P
,
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
Using calipers on micrometer
No failure should be observed when
*
300% of the rated voltage
(C0∆ to U2J and SL) or
*
250% of the rated voltage (X5R, X7R,
Z5U and Y5V) is applied between the terminations for 1 to 5
seconds, provided the charge/discharge current is less than
50mA.
*
200% for 500V
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at 25D and 75%RH
max. and within 2 minutes of charging.
The capacitance/Q/D.F. should be measured at 25D at the
frequency and voltage shown in the table.
[R6, R7]
W.V. : 25Vmin. : 0.025max.
W.V. : 16/10V : 0.035max.
W.V. : 6.3V
0.05max.(CF3.3µF)
0.1max.(CU3.3µF)
[E4]
W.V. : 25Vmin. : 0.025max.
[F5]
W.V. : 25Vmin.
: 0.05max.(CF0.10µF)
: 0.09max.(CU0.10µF)
W.V. : 16V/10V : 0.125max.
W.V. : 6.3Vmax. : 0.15max.
R6 : WithinT15%
(Y55 to
W85D)
R7 : Within±15%
(Y55 to
W125D)
E4 : Within
W22/Y56%
(W10 to
W85D)
F5 : Within
W22/Y82%
(Y30 to
W85D)
Char.
Item
∆C
to 7U, 1X
(1000pF and
below)
∆C
to 7U, 1X
(more than
1000pF)
R6, R7, F5
(10µF and below)
R6, R7, F5
(more than 10µF)
E4
Frequency
1T0.1MHz
Voltage
0.5 to 5Vrms
1
Operating
Temperature
Y55
to
W125D
4
2
Rated Voltage
See the previous page.
3
4
Appearance
Dimensions
No defects or abnormalities
Within the specified dimensions
5
Dielectric Strength
No defects or abnormalities
6
7
Insulation
Resistance
Capacitance
More than 10,000MΩ or 500Ω • F (Whichever is smaller)
Within the specified tolerance
8
Q/
Dissipation Factor
(D.F.)
30pFmin. : Q
U1000
30pFmax. : Q
U400+20C
C : Nominal Capacitance (pF)
1T0.1kHz
1T0.2Vrms
1T0.1kHz
1T0.2Vrms
120T24Hz
1T0.1kHz
0.5T0.1Vrms
0.5T0.05Vrms
Capacitance
Change
Within the specified tolerance
(Table A)
9
Capacitance
Temperature
Characteristics
The capacitance change should be measured after 5 min. at
each specified temperature stage.
(1) Temperature Compensating Type
The temperature coefficient is determined using the
Capacitance measured in step 3 as a reference.
When cycling the temperature sequentially from step 1 through
5 (C0∆ :
W25D
to
W125D
: other temp. coeffs. :
W25D
to
W85D)
the capacitance should be within the specified tolerance
for the temperature coefficient and capacitance change as
Table A.
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in steps
1, 3 and 5 by the capacitance value in step 3.
Step
1
2
3
4
Temperature(D)
25T2
Y55T3
(for
∆C
to 7U/1X/R6/R7)
Y30T3
(for F5)
10T3 (for E4)
25T2
125T3 (for
∆C/R7)
85T3 (for other TC)
25T2
Temperature
Coefficient
Within the specified tolerance
(Table A)
Capacitance
Drift
Within
T0.2%
or
T0.05pF
(Whichever is larger.)
*Does
not apply to 1X/25V
5
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the above
25D value over the temperature ranges shown in the table
should be within the specified ranges.
Continued on the following page.
22
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