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10.12.20
GQM Series Specifications and Test Methods
For General
GRM Series
No.
1
Item
Operating
Temperature
Y55
to 125D
Specifications
Test Method
Reference Temperature: 25D
The rated voltage is defined as the maximum voltage that may
be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
P-P
or V
O-P
,
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
Using calipers
No failure should be observed when 300%
∗
of the rated voltage
is applied between the terminations for 1 to 5 seconds,
provided the charge/discharge current is less than 50mA.
∗
GQM187, GQM219(250V), GQM22: 250% of the rated voltage
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at 25D and 75%RH
max. and within 2 minutes of charging, provided the
charge/discharge current is less than 50mA.
The capacitance/Q should be measured at 25D at the
frequency and voltage shown in the table.
Frequency
Voltage
2
Rated Voltage
See the previous page.
Array
GNM Series
3
4
Appearance
Dimension
No defects or abnormalities
Within the specified dimensions
5
Dielectric Strength
No defects or abnormalities
Low ESL
LLp Series
6
Insulation Resistance
More than 10,000MΩ
7
Capacitance
Within the specified tolerance
30pF and over: QU1400
30pF and below: QU800W20C
C: Nominal Capacitance (pF)
8
Q
1T0.1MHz
0.5 to 5Vrms
High-Q
GJM Series
Temperature
Coefficient
Within the specified tolerance (Table A)
9
High Frequency
GQM Series
Capacitance
Temperature
Characteristics Capacitance
Drift
Within
T0.2%
or
T0.05pF
(whichever is larger)
The capacitance change should be measured after 5 min. at
each specified temp. stage.
The temperature coefficient is determined using the capacitance
measured in step 3 as a reference.
When cycling the temperature sequentially from steps 1 through 5
the capacitance should be within the specified tolerance for the
temperature coefficient and capacitance change as in Table A.
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the
steps 1, 3 and 5 by the capacitance value in step 3.
Step
1
2
3
4
5
Temperature (D)
Reference Temp.
T2
Y55T3
Reference Temp.
T2
125T3
Reference Temp.
T2
Monolithic Microchip
GMA Series
No removal of the terminations or other defect should occur.
c
10
Adhesive Strength
of Termination
b
a
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig. 1 using a eutectic solder. Then apply 10N* force in parallel
with the test jig for 10T1 sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
*5N (GQM188)
Type
GQM18
GQM21
GQM22
a
1.0
1.2
2.2
Fig. 1
b
3.0
4.0
5.0
c
1.2
1.65
2.9
(in mm)
Solder the capacitor to the test jig (glass epoxy board) in the
same manner and under the same conditions as (10).
The capacitor should be subjected to a simple harmonic motion
having a total amplitude of 1.5mm, the frequency being varied
uniformly between the approximate limits of 10 and 55Hz. The
frequency range, from 10 to 55Hz and return to 10Hz, should
be traversed in approximately 1 minute.
This motion should be applied for a period of 2 hours in each of
3 mutually perpendicular directions (total of 6 hours).
Continued on the following page.
Solder resist
For Bonding
GMD Series
Baked electrode or
copper foil
Appearance
Capacitance
11
Vibration
Resistance
Q
No defects or abnormalities
Within the specified tolerance
30pF and over: QU1400
30pF and below: QU800W20C
C: Nominal Capacitance (pF)
Product Information
108
MURATA [ MURATA MANUFACTURING CO., LTD. ]
