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GRM2195C1H562JA01D 参数 Datasheet PDF下载

GRM2195C1H562JA01D图片预览
型号: GRM2195C1H562JA01D
PDF下载: 下载PDF文件 查看货源
内容描述: 片状独石陶瓷电容器 [Chip Monolithic Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 221 页 / 4341 K
品牌: MURATA [ muRata ]
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• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our  
C02E.pdf  
!Note  
sales representatives or product engineers before ordering.  
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.  
10.12.20  
GNM Series Specifications and Test Methods (1)  
When no "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (1).  
Continued from the preceding page.  
When "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (2).  
Specifications  
No.  
Item  
Test Method  
Temperature  
Compensating Type  
High Dielectric Type  
Temperature  
Cycle  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as (10). Perform the five cycles  
according to the four heat treatments listed in the following  
table. Let sit for 24±2 hours (temperature compensating type)  
or 48±4 hours (high dielectric constant type) at room  
temperature, then measure.  
Appearance No marking defects  
Within ±2.5%  
or ±0.25pF  
Capacitance  
R7, R6, C7: Within ±7.5%  
Change  
(whichever is  
larger)  
Step  
1
2
3
4
30pF min.: QU1000  
30pF max.:  
15  
Min.  
Max.  
Room  
Temp.  
Room  
Temp.  
Temp. (°C) Operating  
Operating  
Temp. +3/–0  
30±3  
Char. 25V min. 16V  
R7, R6, 0.025 0.035 0.035 0.05  
C7 max. max. max. max.  
10V  
6.3V  
QU400+20C  
Temp.+0/–3  
Q/D.F.  
I.R.  
Time (min.)  
30±3  
2 to 3  
2 to 3  
C:Nominal  
• Initial measurement for high dielectric constant type  
Capacitance (pF)  
Perform a heat treatment at 150+0/-10°C for one hour and  
then let sit for 24±2 hours at room temperature.  
Perform the initial measurement.  
More than 10,000Mor 500· F (whichever is smaller)  
Dielectric  
Strength  
No failure  
Humidity Steady  
State  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Appearance No marking defects  
Within ±5%  
or ±0.5pF  
Capacitance  
Change  
R7, R6, C7: Within ±12.5%  
(whichever is  
larger)  
Set the capacitor at 40±2°C and 90 to 95% humidity for 500±12  
30pF and over:  
hours.  
16  
QU350  
Remove and let sit for 24±2 hours at room temperature, then  
10pF and over,  
30pF and below:  
QU275+5C/2  
10pF and below:  
QU200+10C  
measure.  
Char. 25V min. 16V  
10V/6.3V  
0.05  
max.  
Q/D.F.  
R7, R6,  
C7  
0.05  
max.  
0.05  
max.  
C: Nominal  
Capacitance (pF)  
I.R.  
More than 1,000Mor 50· F (whichever is smaller)  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Humidity Load  
Appearance No marking defects  
Within ±7.5%  
or ±0.75pF  
Capacitance  
Change  
R7, R6, C7: Within ±12.5%  
(whichever is  
larger)  
Apply the rated voltage at 40±2°C and 90 to 95% humidity for  
500±12 hours.  
17  
Remove and let sit for 24±2 hours at room temperature, then  
measure.  
The charge/discharge current is less than 50mA.  
30pF and over:  
QU200  
30pF and below:  
Char. 25V min. 16V  
10V/6.3V  
Q/D.F.  
I.R.  
QU100+10C/3  
R7, R6,  
C7  
0.05  
max.  
0.05  
max.  
0.05  
max.  
C: Nominal  
Capacitance (pF)  
More than 500Mor 25· F (whichever is smaller)  
Continued on the following page.  
72